Photo sensor for use as a radiation detector and power supply and method for making and using the device
US-2015369928-A1 · Dec 24, 2015 · US
Method and device for detecting ionising radiation using a pixelated photodetector
US9322937B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9322937-B2 |
| Application number | US-201314434287-A |
| Country | US |
| Kind code | B2 |
| Filing date | Oct 8, 2013 |
| Priority date | Oct 8, 2012 |
| Publication date | Apr 26, 2016 |
| Grant date | Apr 26, 2016 |
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Abstract
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A method for detecting ionizing radiation using a pixelated semi-conductor detector. When the radiation interacts with the detector, the affected pixel is determined, together with the instant of impact for this pixel. A first instant before and a second instant after the instant of impact are deduced from this. The deviations of the signals coming from an assembly of pixels adjacent to the affected point are then measured, with the deviations being measured between the first and second instants. The position of the point of interaction of the radiation with the semi-conductor is estimated from the deviations thus measured.
First claim
Opening claim text (preview).
The invention claimed is: 1. A method for detecting ionising radiation with aid of a semi-conductor detector which is pixelated into a number of pixels, wherein each pixel provides a signal which is characteristic of a charge it collects during interaction of ionising radiation with the detector, the method comprising: (a) determination of a pixel, as an affected pixel, whose signal amplitude exceeds a predetermined threshold; (b) determination of an instant (t 0 ), as an instan…
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- G01T1/24Primary
Physics · mapped topic
Physics · mapped topic
- G01T1/2928Primary
Physics · mapped topic
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- What does patent US9322937B2 cover?
- A method for detecting ionizing radiation using a pixelated semi-conductor detector. When the radiation interacts with the detector, the affected pixel is determined, together with the instant of impact for this pixel. A first instant before and a second instant after the instant of impact are deduced from this. The deviations of the signals coming from an assembly of pixels adjacent to the aff…
- Who is the assignee on this patent?
- Commissariat Energie Atomique, Commissariat à l'énergie atomique et aux énergies alternatives
- What technology area does this patent fall under?
- Primary CPC classification G01T1/24. Mapped technology areas include Physics.
- When was this patent published?
- Publication date Tue Apr 26 2016 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
- What related patents are in patentsdb?
- We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).