Solar cell inspection apparatus and solar cell processing apparatus

Patent metadata

Field	Value
Publication number	US-9322786-B2
Application number	US-201214377725-A
Country	US
Kind code	B2
Filing date	Feb 10, 2012
Priority date	Feb 10, 2012
Publication date	Apr 26, 2016
Grant date	Apr 26, 2016

Abstract

An inspection apparatus 1 for solar cells 100 includes: a visible light source 11 adapted to irradiate visible light; a CCD camera 15 adapted to measure a reflection image based on the visible light reflected by an antireflective film of a solar cell 100 ; an infrared light source 13 adapted to irradiate the solar cell 100 with infrared light; and a CCD camera 16 adapted to measure a transmission image based on the infrared light transmitting through the solar cell 100 . In the inspection apparatus 1 , as a result of comparing the reflection image and the transmission image with each other, of areas respectively appearing as bright spots in the reflection image, an area appearing as a dark spot in the transmission image is determined as an area including a particle, whereas of the areas respectively appearing as the bright spots in the reflection image, an area other than the area determined as the area including the particle is determined as an area including a pinhole.

First claim

The invention claimed is:

1. A solar cell inspection apparatus adapted to inspect a solar cell deposited with an antireflective film, the solar cell inspection apparatus comprising:
visible light irradiation means adapted to irradiate visible light to the solar cell from an antireflective film side of the solar cell;
reflection image measuring means adapted to measure a reflection image based on the visible light that is irradiated from the visible light irradiation means and reflected by the antireflective film of the solar cell;
infrared light irradiation means adapted to irradiate infrared light from a side opposite to the antireflective film of the solar cell;
transmission image measuring means adapted to measure a transmission image based on the infrared light that is irradiated from the infrared light irradiation means and transmits through the solar cell;
comparison means adapted to compare the reflection image measured by the reflection image measuring means and the transmission image measured by the transmission image measuring means with each other; and
determination means adapted to determine, of areas respectively appearing as bright spots in the reflection image, an area appearing as a dark spot in the transmission image as an area including a foreign substance present on the antireflective film, and also determine, of the areas respectively appearing as the bright spots in the reflection image, an area other than the area determined as the area including the foreign substance as an area including a pinhole formed in the antireflective film.

2. The solar cell inspection apparatus according to claim 1 , wherein
the visible light irradiation means and the infrared light irradiation means simultaneously irradiate one surface and the other surface of the solar cell with the visible light and the infrared light, respectively,
the solar cell inspection apparatus comprising
a beam splitter adapted to receive the visible light reflected by the antireflective film of the solar cell and the infrared light transmitting through the solar cell; guide the visible light reflected by the antireflective film of the solar cell to the reflection image measuring means, and also guide the infrared light transmitting through the solar cell to the transmission image measuring means.

3. A solar cell processing apparatus adapted to process a solar cell deposited with an antireflective film, the solar cell processing apparatus comprising
an inspection apparatus having:
visible light irradiation means adapted to irradiate visible light from an antireflective film side of the solar cell;
reflection image measuring means adapted to measure a reflection image based on the visible light that is irradiated from the visible light irradiation means and reflected by the antireflection film of the solar cell;
infrared light irradiation means adapted to irradiate infrared light from a side opposite to the antireflective film of the solar cell;
transmission image measuring means adapted to measure a transmission image based on the infrared light that is irradiated from the infrared light irradiation means and transmitting through the solar cell;
comparison means adapted to compare the reflection image measured by the reflection image measuring means and the transmission image measured by the transmission image measuring means with each other; and
determination means adapted to determine, of areas respectively appearing as bright spots in the reflection image, an area appearing as a dark spot in the transmission image as an area including a foreign substance present on the antireflective film, and also determine, of the areas respectively appearing as the bright spots in the reflection image, an area other than the area determined as the area including the foreign substance as an area including a pinhole formed in the antireflective film, and a foreign substance removing device adapted to remove the foreign substance in the area that is determined as the area including the foreign substance present on the antireflective film by the determination means of the inspection apparatus.

4. The solar cell processing apparatus according to claim 3 , wherein
the foreign substance removing device comprises a foreign substance removing part adapted to remove the foreign substance in the area determined as the area including the foreign substance present on the antireflective film by the determination means of the inspection apparatus by blowing gas toward the area or performing suction on the area.

5. The solar cell processing apparatus according to claim 4 , wherein
the foreign substance removing device comprises a second inspection apparatus adapted to inspect the solar cell after the foreign substance has been supposed to be removed by the foreign substance removing part, and thereby inspect whether or not the foreign substance on the antireflective film of the solar cell is present.

6. The solar cell processing apparatus according to claim 5 , comprising:
a main conveyance path adapted to convey a solar cell to an area including the inspection apparatus; and
a conveyance mechanism adapted to, between the main conveyance path and the foreign substance removing device, convey the solar cell in which it is determined by the determination means of the inspection apparatus that the area including the foreign substance is present on the antireflective film.

7. The solar cell processing apparatus according to claim 6 , comprising
a discharge mechanism adapted to, from the main conveyance path, discharge the solar cell in which it is determined by the determination means of the inspection apparatus that the area including the pinhole formed in the antireflective film is present.

Assignees

• Takami Yoshio
• Shimadzu Corp

Inventors

• Takami Yoshio

Classifications

• H10F71/00

  Manufacture or treatment of devices covered by this subclass (patterning processes to connect thin photovoltaic cells in integrated devices, or assemblies of multiple devices, having photovoltaic cells H10F19/33; manufacture or treatment of encapsulations or containers for integrated devices, or assemblies of multiple devices, having photovoltaic cells H10F19/80; manufacture or treatment of integrated devices, or assemblies of multiple devices, comprising at least one element in which radiation controls the flow of current H10F39/00) · CPC title

• H02S50/10

  Testing of PV devices, e.g. of PV modules or single PV cells (testing of semiconductor devices during manufacturing {H10P74/00}) · CPC title

• G01N21/894

  Pinholes · CPC title

• H01L31/18

  Electricity · mapped topic

• G01N2201/02

  Mechanical · CPC title