Capacitor and semiconductor device including the same
US-2024387608-A1 · Nov 21, 2024 · US
US9318485B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9318485-B2 |
| Application number | US-201213571453-A |
| Country | US |
| Kind code | B2 |
| Filing date | Aug 10, 2012 |
| Priority date | Aug 10, 2012 |
| Publication date | Apr 19, 2016 |
| Grant date | Apr 19, 2016 |
A practical reading order for non-experts. Skip the full description unless you need deep technical detail.
What the patent document calls the invention.
A short plain-language summary of the technical disclosure.
Who owns or filed the patent and who is credited as inventor.
Filing, priority, publication, and grant dates set the timeline.
The legal scope of protection — read this for what is actually claimed.
Technology tags used to group this patent with similar filings.
Prior art links and similar publications in this corpus.
Official abstract text for this publication.
In various embodiments, a capacitor arrangement is provided, which may include a substrate; a plurality of first doped regions and a plurality of second doped regions, wherein the first doped regions are doped with dopants of a first conductivity type and the second doped regions are doped with dopants of a second conductivity type being opposite to the first conductivity type, and wherein the plurality of first doped regions and the plurality of second doped regions are alternatingly arranged next to each other in the substrate; a dielectric layer disposed over the plurality of first doped regions and the plurality of second doped regions; an electrode disposed over the dielectric layer; a first terminal electrically coupled to each doped region of the plurality of first doped regions and the plurality of second doped regions; and a second terminal electrically coupled to the electrode.
Opening claim text (preview).
What is claimed is: 1. A capacitor arrangement, comprising: a doped region having an n-type doping or a p-type doping; a dielectric layer disposed over the doped region; a plurality of electrodes, wherein the electrodes are arranged next to each other and disposed over the dielectric layer, wherein respectively adjacent electrodes have opposite doping types to each other; and a first terminal, wherein the first terminal is electrically coupled to the doped region; and a second terminal, wherein the second terminal is electrically coupled to each electrode of the plurality of electrodes. 2. The capacitor arrangement of claim 1 , wherein the doped region is configured as a well. 3. The capacitor arrangement of claim 1 , wherein the doping type is an n doping type or a p doping type. 4. The capacitor arrangement of claim 1 , wherein the dielectric layer comprises at least one of the following materials: silicon dioxide; silicon nitride; and a high-κ dielectric. 5. The capacitor arrangement of claim 1 , wherein the electrode comprises polycrystalline silicon. 6. The capacitor arrangement of claim 1 , wherein the electrodes have a respective width of less than 20 μm. 7. A capacitor arrangement, comprising: a substrate; a plurality of wells, wherein the wells are arranged as columns in the substrate, wherein adjacent wells have opposite doping types; a dielectric layer, wherein the dielectric layer is disposed over the plurality of wells; a plurality of electrodes, wherein the electrodes are arranged as rows on at least a region of the dielectric layer that is disposed over the plurality of wells, wherein adjacent electrodes have opposite doping types; and a first terminal, wherein the first terminal is electrically coupled to each well of the plurality of wells; and a second terminal, wherein the second terminal is electrically coupled to each electrode of the plurality of electrodes. 8. The capacitor arrangement of claim 7 , wherein the doping type is an n doping type or a p doping type. 9. The capacitor arrangement of claim 7 , wherein the columns and the rows are arranged orthogonal to each other. 10. The capacitor arrangement of claim 7 , wherein the dielectric layer comprises at least one of the following materials: silicon dioxide; silicon nitride; and a high-κ dielectric. 11. The capacitor arrangement of claim 7 , wherein the electrode comprises polycrystalline silicon. 12. The capacitor arrangement of claim 7 , wherein the rows have a width of less than 20 μm. 13. The capacitor arrangement of claim 12 , wherein the columns have a width of less than 20 μm.
Combinations of field-effect devices and one or more diodes, capacitors or resistors · CPC title
Silicon carbide · CPC title
of only conductor-insulator-semiconductor capacitors · CPC title
Schottky-barrier diodes · CPC title
Diodes (variable-capacitance diodes H10D1/64; gated diodes H10D12/00) · CPC title
Related publications grouped by family.
Answers are generated from the same data shown on this page.