Flaw-detection apparatus and flaw-detection method
US-9494558-B2 · Nov 15, 2016 · US
Apparatus and method for eddy current inspection of structures
US9316617B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9316617-B2 |
| Application number | US-201313925804-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jun 24, 2013 |
| Priority date | Jun 24, 2013 |
| Publication date | Apr 19, 2016 |
| Grant date | Apr 19, 2016 |
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Abstract
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There is provided a probe apparatus. The probe apparatus has a first end configured to connect to a rotating scanner device. The probe apparatus further has a second end with two or more eddy current elements. The second end further has a positioning mechanism configured to position the two or more eddy current elements against cavity walls of an annular cavity of a structure to be inspected with the probe apparatus, when the probe apparatus is positioned within the annular cavity. The second end further has an aligning mechanism coupled to the positioning mechanism. The aligning mechanism is configured to align the two or more eddy current elements in a perpendicular position with respect to the cavity walls of the annular cavity, when the probe apparatus is positioned within the annular cavity.
First claim
Opening claim text (preview).
What is claimed is: 1. A probe apparatus comprising: a first end configured to connect to a rotating scanner device; and, a second end comprising: two or more eddy current elements comprising at least one reference eddy current coil and at least one test eddy current coil; a positioning mechanism configured to position the two or more eddy current elements against cavity walls of an annular cavity of a structure to be inspected with the probe apparatus, when the probe apparat…
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- G01N27/90Primary
Physics · mapped topic
- G01N27/902Primary
Physics · mapped topic
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- What does patent US9316617B2 cover?
- There is provided a probe apparatus. The probe apparatus has a first end configured to connect to a rotating scanner device. The probe apparatus further has a second end with two or more eddy current elements. The second end further has a positioning mechanism configured to position the two or more eddy current elements against cavity walls of an annular cavity of a structure to be inspected wi…
- Who is the assignee on this patent?
- Boeing Co
- What technology area does this patent fall under?
- Primary CPC classification G01N27/90. Mapped technology areas include Physics.
- When was this patent published?
- Publication date Tue Apr 19 2016 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
- What related patents are in patentsdb?
- We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).