Method for manufacturing liquid discharge head

US9315026B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9315026-B2
Application numberUS-201514824954-A
CountryUS
Kind codeB2
Filing dateAug 12, 2015
Priority dateAug 19, 2014
Publication dateApr 19, 2016
Grant dateApr 19, 2016

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A method for manufacturing a liquid discharge head. The method includes a first step of forming a telecentric measurement pattern A by exposure, the telecentric measurement pattern A being part of a measurement pattern that allows determination of inclination of a principal ray caused by an off-axis telecentric degree occurring in a projection exposing device, and a second step of forming a telecentric measurement pattern B by exposure under an exposure condition defocused from an exposure condition in the first step, the telecentric measurement pattern B being another part of the measurement pattern, which allows the determination of the inclination of the principal ray caused by the off-axis telecentric degree occurring in the projection exposing device. The off-axis telecentric degree is determined from an amount of misalignment between relative forming positions of the telecentric measurement patterns A and B and an amount of defocusing.

First claim

Opening claim text (preview).

What is claimed is: 1. A method for manufacturing a liquid discharge head, the method including a step of forming a discharge port pattern at a layer containing a photosensitive resin material by exposure using a projection exposing device, the method comprising: a first step of forming a telecentric measurement pattern A by exposure through a mask, the telecentric measurement pattern A being part of a measurement pattern that allows determination of inclination of a principal ray caused by an off-axis telecentric degree occurring in the projection exposing device; and a second step of forming a telecentric measurement pattern B by exposure through a mask under an exposure condition defocused from an exposure condition in the first step, the telecentric measurement pattern B being another part of the measurement pattern, which allows the determination of the inclination of the principal ray caused by the off-axis telecentric degree occurring in the projection exposing device, wherein the off-axis telecentric degree is determined from an amount of misalignment between relative forming positions of the telecentric measurement pattern A and the telecentric measurement pattern B and an amount of defocusing. 2. The method according to claim 1 , wherein in the second step, the discharge port pattern is formed by exposure together with the telecentric measurement pattern B under the exposure condition defocused from the exposure condition in the first step. 3. The method according to claim 1 , wherein at least one of the telecentric measurement pattern A and the telecentric measurement pattern B is formed on a first surface of the layer containing the photosensitive resin material. 4. The method according to claim 3 , wherein a focus position of the telecentric measurement pattern A or the telecentric measurement pattern B is set on the first surface of the layer containing the photosensitive resin material. 5. The method according to claim 1 , wherein the telecentric measurement pattern B is formed inside the telecentric measurement pattern A. 6. The method according to claim 1 , wherein a center position of gravity of the telecentric measurement pattern A formed on the mask in the first step and a center position of gravity of the telecentric measurement pattern B formed on the mask in the second step coincide with each other. 7. The method according to claim 1 , wherein a shape of the telecentric measurement pattern A formed on the mask is similar to a shape of the telecentric measurement pattern B formed on the mask. 8. The method according to claim 1 , wherein a size of the telecentric measurement pattern B is 10% to 90% of a size of the telecentric measurement pattern A. 9. The method according to claim 1 , wherein a shortest distance between the telecentric measurement pattern A and a discharge port nearest the telecentric measurement pattern A is 20 μm or more. 10. The method according to claim 1 , wherein the amount of defocusing is 1 μm or more. 11. A method for manufacturing an inkjet print head including a plurality of liquid discharge heads, the method comprising: a step of manufacturing the plurality of liquid discharge heads by the method according to claim 1 ; and a step of selecting liquid discharge heads having the determined off-axis telecentric degrees close to each other.

Assignees

Inventors

Classifications

  • Multi-step exposure, e.g. hybrid; backside exposure; blanket exposure, e.g. for image reversal; edge exposure, e.g. for edge bead removal; corrective exposure · CPC title

  • B41J2/1631Primary

    photolithography · CPC title

  • Manufacturing of the nozzle plates · CPC title

  • of the front shooter type · CPC title

  • comprising an imagewise exposure to electromagnetic radiation or corpuscular radiation · CPC title

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What does patent US9315026B2 cover?
A method for manufacturing a liquid discharge head. The method includes a first step of forming a telecentric measurement pattern A by exposure, the telecentric measurement pattern A being part of a measurement pattern that allows determination of inclination of a principal ray caused by an off-axis telecentric degree occurring in a projection exposing device, and a second step of forming a tel…
Who is the assignee on this patent?
Canon Kk
What technology area does this patent fall under?
Primary CPC classification B41J2/1631. Mapped technology areas include Operations & Transport.
When was this patent published?
Publication date Tue Apr 19 2016 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).