Real-time rule engine for adaptive testing of integrated circuits

Patent metadata

Field	Value
Publication number	US-9311201-B2
Application number	US-201213591855-A
Country	US
Kind code	B2
Filing date	Aug 22, 2012
Priority date	Aug 22, 2012
Publication date	Apr 12, 2016
Grant date	Apr 12, 2016

Abstract

A method of testing a device is disclosed. Test data is obtained for a device testing program that tests the device. An adaptation command for testing the device is determined at an adaptive testing engine using obtained test data. The adaptation command is sent from the adaptive testing engine to a tool control application. The tool control application uses the adaptation command to control an operation related to the testing of the device.

First claim

What is claimed is:

1. A method of testing a device under test (DUT), comprising:
providing a circuit tester that includes a tool control application and a device testing pro gram;
providing a communication between the tool control application and a user interface;
using a handler to provide an interface between the circuit tester and the DUT, wherein the tool control application coordinates an operation of the handler and the device testing pro gram;
testing the DUT using the device testing program of the circuit tester;
using a data sniffer to intercept test results as they are generated by the device testing program and forward the test results to a real-time rule engine;
determining an adaptation command for testing the device at the real-time rule engine using the test results;
sending the adaptation command from the real-time rule engine to a tool control application of the circuit tester, wherein the tool control application implements the adaptation command and separately supervises the operation of the circuit tester;
using the adaptation command at the tool control application to customize a behavior of the tool control application for a particular DUT; and
testing the DUT using the customized behavior.

2. The method of claim 1 , wherein the adaptation command further comprises at least one of: initiating a test; discontinuing a test; pausing a test; and restarting a test.

3. The method of claim 1 , further comprising using the adaptation command at the tool control application to alter a parameter related to a behavior of the device testing program.

4. The method of claim 3 , wherein the adaptation command further comprises at least one of: selecting the DUT; coupling a probe to the DUT; cleaning a probe; compiling data; storing data; communicating data to a user interface; and obtaining instructions from a user at the user interface.

5. The method of claim 1 , further comprising dynamically loading one or more testing rules into the adaptive testing engine, wherein the one or more testing rules are specific to the DUT.

6. The method of claim 1 , wherein the DUT further comprises a wafer selected from a plurality of wafers, further comprising determining a testing order of the plurality of wafers.

7. The method of claim 1 , further comprising storing the adaptation command with test data obtained using the adaptation command.

8. The method of claim 1 , further comprising using the tool control application to reinstate a test which has been disabled by an adaptation command provided by the real-time rule engine.

9. The method of claim 1 , wherein customizing a behavior further comprises customizing an activity of the handler.

Assignees

• Atkinson David E
• Grady Matthew S
• Lacroix Donald L
• Lutton Ii David B
• Pepper Bradley D
• Steel Randolph P
• IBM

Inventors

• Atkinson David E
• Grady Matthew S
• Lacroix Donald L
• Lutton Ii David B
• Pepper Bradley D
• Steel Randolph P

Classifications

• G01R31/31908

  Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns · CPC title

• G01R31/31903

  tester configuration · CPC title

• G01R31/31905

  Interface with the device under test [DUT], e.g. arrangements between the test head and the DUT, mechanical aspects, fixture · CPC title

• G06F11/263 Primary

  Generation of test inputs, e.g. test vectors, patterns or sequences {; with adaptation of the tested hardware for testability with external testers} · CPC title