Apparatus for testing thyristor valve

Patent metadata

Field	Value
Publication number	US-9310421-B2
Application number	US-201313890059-A
Country	US
Kind code	B2
Filing date	May 8, 2013
Priority date	May 22, 2012
Publication date	Apr 12, 2016
Grant date	Apr 12, 2016

Abstract

An apparatus for testing a thyristor valve includes: a current source circuit that provides an electric current when a thyristor valve as a test target is turned on; a voltage source circuit that provides a reverse voltage or a forward voltage when the thyristor valve is turned off; and a first auxiliary valve provided between a connection point between the thyristor valve and the voltage source circuit and the current source circuit, and that insulates the current source circuit from the voltage source circuit to protect the current source circuit from a high voltage of the voltage source circuit.

First claim

What is claimed is:

1. An apparatus for testing a thyristor valve, the apparatus comprising:
a current source circuit that provides an electric current when a thyristor valve as a test target is turned on;
a voltage source circuit that provides a reverse voltage or a forward voltage when the thyristor valve is turned off;
a first auxiliary valve provided between a connection point between the thyristor valve and the voltage source circuit and the current source circuit, and that insulates the current source circuit from the voltage source circuit to protect the current source circuit from a high voltage of the voltage source circuit; and
an auxiliary circuit that forcibly turns off the first auxiliary valve when the thyristor valve is turned off,
wherein the auxiliary circuit comprises:
a first direct current (DC) source circuit section that generates a DC voltage for turning off the first auxiliary valve;
an auxiliary switch having one end connected to an anode output terminal of the first DC source circuit section and the other end connected to the current source circuit; and
a capacitor having one end connected to the auxiliary switch and the other end connected to a connection point between the current source circuit and the first auxiliary valve.

2. The apparatus of claim 1 , wherein the current source circuit comprises:
a second DC source circuit section that changes a DC voltage and supply the DC voltage while controlling an increase rate of a current provided to the thyristor valve; and
a chopper circuit that steps down an output voltage from the second DC source circuit section.

3. The apparatus of claim 2 , wherein the second DC source circuit section is configured by any one of a 6-pulses phase control rectifier, a 12-pulses phase control rectifier, and a 18-pulses phase control rectifier.

4. The apparatus of claim 2 , wherein the chopper circuit comprises:
a first switch having one end connected to an anode output terminal of the second DC source circuit section;
a first diode provided between the first switch and a cathode output terminal of the second DC source circuit section;
a first inductor connected to a connection point between the first switch and the first diode; and
a second switch provided between the first inductor and the first auxiliary valve.

5. The apparatus of claim 2 , wherein the chopper circuit is configured by a single-phase chopper circuit, or a multi-phases chopper circuit.

6. The apparatus of claim 5 , wherein the first switch and the second switch are configured by any one of an IGBT (Insulated Gate Bipolar Transistor) and an IGCT (Integrated Gate-Commutated Thyristor), respectively.

7. The apparatus of claim 1 , wherein the second DC source circuit section is configured by any one of a 6-pulses diode rectifier, a 12-pulses diode rectifier, and a 18-pulses diode rectifier that converts an AC voltage into a DC voltage.

8. The apparatus of claim 1 , wherein the auxiliary switch is an IGBT (Insulated Gate Bipolar Transistor) or an IGCT (Integrated Gate-Commutated Thyristor).

Assignees

• Lsis Co Ltd
• Myongji Univ Ind & Acad Coop
• Corp Foundation

Inventors

• Baek Seung Taek
• Han Byung Moon
• Nho Eui Cheol
• Chung Yong Ho
• Lee Wook Hwa

Classifications

• G01R31/31924

  Voltage or current aspects, e.g. driver, receiver · CPC title

• G01R31/40

  Testing power supplies (testing photovoltaic devices H02S50/10) · CPC title

• G01R31/3336

  Synthetic testing, i.e. with separate current and voltage generators simulating distance fault conditions · CPC title

• G01R31/00

  Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere ({measuring superconductive properties G01R33/1238;} testing line transmission systems H04B3/46; testing or measuring semiconductors or solid state devices during manufacture {H10P74/00}) · CPC title

• G01R31/263 Primary

  for testing thyristors · CPC title