Semiconductor device and manufacturing method
US-2015325698-A1 · Nov 12, 2015 · US
US9305789B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9305789-B2 |
| Application number | US-201514693118-A |
| Country | US |
| Kind code | B2 |
| Filing date | Apr 22, 2015 |
| Priority date | May 8, 2014 |
| Publication date | Apr 5, 2016 |
| Grant date | Apr 5, 2016 |
A practical reading order for non-experts. Skip the full description unless you need deep technical detail.
What the patent document calls the invention.
A short plain-language summary of the technical disclosure.
Who owns or filed the patent and who is credited as inventor.
Filing, priority, publication, and grant dates set the timeline.
The legal scope of protection — read this for what is actually claimed.
Technology tags used to group this patent with similar filings.
Prior art links and similar publications in this corpus.
Official abstract text for this publication.
A semiconductor device comprising at least one active layer on a substrate and a a Schottky contact to the at least one active layer, the Schottky contact comprising a body of at least titanium and nitrogen that is electrically coupled with the at least one active layer.
Opening claim text (preview).
The invention claimed is: 1. A semiconductor device comprising at least one active layer on a substrate and a Schottky contact to the at least one active layer, the Schottky contact comprising a body of at least titanium and nitrogen that is electrically coupled with the at least one active layer; in which the body of the Schottky contact comprises a first TiW sub-layer nearest to the at least one active layer, a second TiW sub-layer farthest from the at least one active layer, and a TiW(N) sub-layer in-between the first and second TiW sub-layers. 2. A semiconductor device according to claim 1 , in which the TiW(N) sub-layer has a thickness exceeding the combined thickness of the first and second TiW sub-layers such that the properties of the sub-layer stack are dominated by the TiW(N) sub-layer. 3. A semiconductor device according to claim 1 , in which the Schottky contact comprises a stack having an active layer portion adapted to be coupled to the at least one active layer and a connection portion coupled to the active layer portion for providing a connection to the Schottky contact, wherein the body forms the active layer portion and the connection portion has a lower resistance than the active layer portion. 4. A semiconductor device according to claim 3 , in which the connection portion comprises Aluminium. 5. A semiconductor device according to claim 1 , in which the Schottky contact is laterally delimited by an electrically insulating material. 6. A semiconductor device according to claim 1 , in which the semiconductor device comprises a gallium nitride active layer. 7. An integrated circuit including the semiconductor device as defined in claim 1 .
of conductive or resistive materials · CPC title
to Group III-V semiconductors · CPC title
Nitride Group III-V materials, e.g. AlN or GaN · CPC title
Electrodes comprising a Schottky barrier to a semiconductor · CPC title
being Group III-V materials, e.g. GaAs · CPC title
Related publications grouped by family.
Answers are generated from the same data shown on this page.