Dielectric ceramic composition and multilayer ceramic capacitor containing the same
US-2015299048-A1 · Oct 22, 2015 · US
US9305708B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9305708-B2 |
| Application number | US-201414445894-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jul 29, 2014 |
| Priority date | Jul 30, 2013 |
| Publication date | Apr 5, 2016 |
| Grant date | Apr 5, 2016 |
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A multilayer ceramic electronic device comprising a lamination in which an internal electrode layer 3 and a dielectric layer 2 are laminated alternatively, wherein the dielectric layer 2 is comprised of a dielectric ceramic composition including a main component represented by a general formula of ABO 3 and a rare-earth component R, and segregation phases 5 including the rare-earth component R are present in the dielectric layer 2 . When the dielectric layer 2 is separated to six areas by dividing the dielectric layer 2 sandwiched by a pair of the internal dielectric layers 3 in the thickness direction, there are the R segregation phases present in two neighboring areas 2 a respectively adjacent to the pair of the internal electrode layers 3 in the dielectric layer 3 at a ratio of double or more compared with the R segregation phases present in two central areas 2 b located at a substantially center in the dielectric layer 2.
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The invention claimed is: 1. A multilayer ceramic electronic device comprising a lamination in which an internal electrode layer and a dielectric layer are laminated alternatively, wherein the dielectric layer is comprised of a dielectric ceramic composition including a main component represented by a general formula of ABO 3 (A is at least one selected from Ba, Sr and Ca, and B is at least one selected from Ti, Zr and Hf) and a rare-earth component R (R is at least one selected from Sc, Y, La, Ce, Pr, Nd, Pm, Sm, Eu, Gd, Tb, Dy, Ho, Er, Tm, Yb and Lu), R segregation phases including the rare-earth component R are present in the dielectric layer, and when the dielectric layer is separated to six areas by dividing the dielectric layer sandwiched by a pair of the internal dielectric layers in the thickness direction, there are the R segregation phases present in two neighboring areas respectively adjacent to the pair of the internal electrode layers in the dielectric layer at a ratio of double or more compared with the R segregation phases present in two central areas located at a substantially center in the dielectric layer. 2. The multilayer ceramic electronic device as set forth in claim 1 , wherein the dielectric layer additionally comprises a sub-component including Si, at least a part of a Si segregation phase including Si is coexistently present at the R segregation phases in the dielectric layer, and a Si.R copresence ratio showing a ratio of an area of a copresence region where the R segregation phases and the Si segregation phase are copresent is 35% or more with respect to an area of a region where the R segregation phases and/or the Si segregation phase are present. 3. The multilayer ceramic electronic device as set forth in claim 1 , wherein a dielectric particle in which the rare-earth component R is at least dissolved in solid on a surface of the main component of ABO 3 is present in the dielectric layer. 4. The multilayer ceramic electronic device as set forth in claim 1 , wherein the dielectric particle in which the rare-earth component R is dissolved in solid from a particle surface of the main component of ABO 3 in a range of 15% or more along a grain diameter is present in the dielectric layer and a ratio of the dielectric particle dissolved in solid in the range of 15% or more is 70% or more with respect to the whole number of the dielectric particles in a predetermined observation visual field. 5. The multilayer ceramic electronic device as set forth in claim 1 , wherein there is a discontinuous part in the internal dielectric layer and the R segregation phases including the rare-earth component R are present at the discontinuous part.
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