Display control device and method
US-2015138236-A1 · May 21, 2015 · US
System and method for image based inspection of an object
US9305345B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9305345-B2 |
| Application number | US-201414260624-A |
| Country | US |
| Kind code | B2 |
| Filing date | Apr 24, 2014 |
| Priority date | Apr 24, 2014 |
| Publication date | Apr 5, 2016 |
| Grant date | Apr 5, 2016 |
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Abstract
Official abstract text for this publication.
A method for image based inspection of an object includes receiving an image of an object from an image capture device, wherein the image includes a representation of the object with mil-level precision. The method further includes projecting a measurement feature of the object from the image onto a three-dimensional (3D) model of the object based on a final projection matrix; determining a difference between the projected measurement feature and an existing measurement feature on the 3D model; and sending a notification including the difference between the projected measurement feature and the existing measurement feature.
First claim
Opening claim text (preview).
What is claimed as new and desired to be protected by Letters Patent of the United States is: 1. A method comprising: receiving an image of an object from an image capture device, wherein the image includes a representation of the object with mil-level precision; projecting a measurement feature of the object from the image onto a three-dimensional (3D) model of the object based on a final projection matrix; determining a difference between the projected measurement feature an…
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Classifications
- G06T7/0004Primary
Physics · mapped topic
- G06T7/001Primary
Physics · mapped topic
Physics · mapped topic
Physics · mapped topic
Physics · mapped topic
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Frequently asked questions
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- What does patent US9305345B2 cover?
- A method for image based inspection of an object includes receiving an image of an object from an image capture device, wherein the image includes a representation of the object with mil-level precision. The method further includes projecting a measurement feature of the object from the image onto a three-dimensional (3D) model of the object based on a final projection matrix; determining a dif…
- Who is the assignee on this patent?
- Gen Electric
- What technology area does this patent fall under?
- Primary CPC classification G06T7/0004. Mapped technology areas include Physics.
- When was this patent published?
- Publication date Tue Apr 05 2016 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
- What related patents are in patentsdb?
- We list 2 related publications on this page (citations in our corpus or others sharing the same primary CPC).