Beam profiler measuring intensity distribution of laser beam, laser oscillator, and laser processing device

US9304036B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9304036-B2
Application numberUS-201514666501-A
CountryUS
Kind codeB2
Filing dateMar 24, 2015
Priority dateMar 28, 2014
Publication dateApr 5, 2016
Grant dateApr 5, 2016

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A beam profiler which can determine whether or not a laser beam can be suitably output at a lower cost. The beam profiler is provided with a partial reflecting mirror, light receiving parts, and laser intensity sensors which are individually attached to the light receiving parts. The light receiving parts include a first light receiving part which receives a first region which includes an optical axis of the laser beam in a laser irradiation region of the laser beam and a second light receiving part which is insulated heat-wise from the first light receiving part and which receives a second region of a laser irradiation region which is different from the first region.

First claim

Opening claim text (preview).

What is claimed is: 1. A beam profiler for measuring an intensity distribution of a laser beam, comprising: a partial reflecting mirror; a plurality of light receiving parts receiving a laser beam passing through the partial reflecting mirror; and a plurality of laser intensity sensors individually attached to the plurality of light receiving parts and sensing the intensity of the laser beam received by the light receiving parts, wherein the plurality of light receiving parts at least includes: a first light receiving part receiving a first region of a laser irradiation region of the laser beam, the first region having a center part of the laser beam; and a second light receiving part thermally-insulated from the first light receiving part and receiving a second region of the laser irradiation region which is different from the first region. 2. The beam profiler according to claim 1 , wherein the laser intensity sensor includes a thermocouple, thermopile, thermistor, or platinum resistance temperature detector. 3. The beam profiler according to claim 1 wherein the laser intensity sensor includes a strain gauge. 4. The beam profiler according to claim 1 , wherein the first light receiving part is a circular member, the second light receiving part is a ring member arranged concentrically with the first light receiving part. 5. The beam profiler according to claim 1 , wherein the second light receiving part is positioned relative to the first light receiving part so that a center of the second light receiving part becomes closer to an outer edge of the laser irradiation region than a center of the first light receiving part. 6. The beam profiler according to claim 1 , further comprising a laser power calculating part calculating the laser power of the laser beam received by the plurality of light receiving parts based on outputs from the plurality of laser intensity sensors. 7. The beam profiler according to claim 6 further comprising a laser power determination part determining whether the laser power is within the range of a predetermined threshold value. 8. The beam profiler according to claim 6 wherein the laser power calculating part calculates a sum of outputs from the plurality of laser intensity sensors, the laser power determination part determines whether the sum is within the range of a predetermined threshold value. 9. The beam profiler according to claim 1 further comprising a distribution calculating part calculating an intensity distribution of the laser beam based on a first output from the laser intensity sensor attached to the first light receiving part and on a second output from the laser intensity sensor attached to the second light receiving part. 10. The beam profiler according to claim 9 further comprising a distribution determining part determining whether an intensity distribution of the laser beam is within the range of a predetermined threshold value. 11. The beam profiler according to claim 10 , wherein the distribution determining part: determines whether the first output is in the range of a first threshold value; and determines whether the second output is in the range of a second threshold value. 12. The beam profiler according to claim 10 further comprising a warning generation part generating a warning to a user when the distribution determining part determines that the intensity distribution of the laser beam is not in the range of a predetermined threshold value. 13. A laser oscillator comprising: an output mirror emitting a laser beam; and a beam profiler according to claim 1 , wherein the partial reflecting mirror of the beam profiler is arranged opposite to the output mirror. 14. A laser processing device comprising: a laser oscillator; and a beam profiler according to claim 1 , wherein the partial reflecting mirror of the beam profiler is arranged on an optical path of a laser beam emitted from the laser oscillator. 15. The laser processing device according to claim 14 , wherein the laser oscillator is a laser oscillator according to claim 13 .

Assignees

Inventors

Classifications

  • arrangements with two or more detectors, e.g. for sensitivity compensation · CPC title

  • Stabilisation of laser output parameters, e.g. frequency or amplitude · CPC title

  • Measuring the characteristics of individual optical pulses or of optical pulse trains · CPC title

  • G01J1/4257Primary

    applied to monitoring the characteristics of a beam, e.g. laser beam, headlamp beam (monitoring arrangements for lasers in general H01S3/0014) · CPC title

  • in gas lasers · CPC title

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What does patent US9304036B2 cover?
A beam profiler which can determine whether or not a laser beam can be suitably output at a lower cost. The beam profiler is provided with a partial reflecting mirror, light receiving parts, and laser intensity sensors which are individually attached to the light receiving parts. The light receiving parts include a first light receiving part which receives a first region which includes an optic…
Who is the assignee on this patent?
Fanuc Corp
What technology area does this patent fall under?
Primary CPC classification G01J1/4257. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Apr 05 2016 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 1 related publication on this page (citations in our corpus or others sharing the same primary CPC).