Capacitor and semiconductor device including the same
US-2024387608-A1 · Nov 21, 2024 · US
US9299765B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9299765-B2 |
| Application number | US-201514687049-A |
| Country | US |
| Kind code | B2 |
| Filing date | Apr 15, 2015 |
| Priority date | Aug 18, 2010 |
| Publication date | Mar 29, 2016 |
| Grant date | Mar 29, 2016 |
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Embodiments include a metal-insulator-metal (MIM) capacitor having: a first electrode; a second electrode disposed proximate the first electrode; an insulator layer between the first and second electrodes; and a reactive layer positioned proximate the insulator layer and configured to allow altering of the reactive layer to change a capacitive value of the MIM capacitor, the reactive layer including a reactive conductor.
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What is claimed is: 1. A metal-insulator-metal (MIM) capacitor comprising: a first electrode; a second electrode disposed proximate the first electrode; an insulator layer between the first and second electrodes; and a reactive layer positioned proximate the insulator layer between the first and second electrodes and configured to allow altering of the reactive layer to change a capacitive value of the MIM capacitor, the reactive layer including a reactive conductor wherein the reactive layer includes silicon dioxide (SiO 2 ) in contact with the reactive conductor. 2. The MIM capacitor of claim 1 , wherein the reactive layer is positioned between the insulator layer and the first electrode. 3. The MIM capacitor of claim 1 , wherein the reactive layer is positioned between the insulator layer and the second electrode. 4. The MIM capacitor of claim 1 , wherein the reactive conductor is selected from the group comprising: aluminum (Al), titanium (Ti) and tantalum (Ta). 5. A metal-insulator-metal (MIM) capacitor comprising: a first electrode; a second electrode disposed proximate the first electrode; an insulator layer between the first and second electrodes; and a reactive layer positioned proximate the insulator layer between the first and second electrodes and configured to allow altering of the first reactive layer to change a capacitive value of the MIM capacitor, the reactive layer including a conductor material of one of: the first electrode and the second electrode wherein the reactive layer includes silicon dioxide (SiO 2 ) in contact with the reactive conductor. 6. The MIM capacitor of claim 5 , wherein the reactive layer includes a portion of the first electrode that is contact with the insulator layer. 7. The MIM capacitor of claim 5 , wherein the reactive layer includes a portion of the second electrode that is contact with the insulator layer. 8. The MIM capacitor of claim 5 , wherein the reactive layer is selected from the group comprising: aluminum (Al), silicon (Si), titanium (Ti) and tantalum (Ta).
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