Shape measuring apparatus

Patent metadata

Field	Value
Publication number	US-9298178-B2
Application number	US-201313893864-A
Country	US
Kind code	B2
Filing date	May 14, 2013
Priority date	May 17, 2012
Publication date	Mar 29, 2016
Grant date	Mar 29, 2016

Abstract

A shape measuring apparatus includes: a probe having a stylus tip; a movable mechanism configured to move the stylus tip; an information acquiring unit configured to acquire design information of a workpiece; a path setting unit configured to set a path of the stylus tip; a path component calculating section configured to calculate a path velocity vector; a push direction component calculating section configured to detect a deflection, and calculate a push correction vector; a locus correction component calculating section configured to detect an amount and a direction of locus deviation of the probe from the path, and calculate a locus correction vector; a velocity synthesizing section configured to calculate a velocity synthesis vector by combining the path velocity vector, the push correction vector, and the locus correction vector; and a drive control unit configured to move the probe according to the velocity synthesis vector.

First claim

What is claimed is:

1. A shape measuring apparatus comprising:
a probe having a stylus tip at the tip;
a mover that moves the stylus tip on a surface of a workpiece to be measured;
an information acquirer, implemented by a processor, that acquires design information of the workpiece;
a path setter, implemented by a processor, that sets a path along which the stylus tip is moved, based on the design information;
a path component calculator, implemented by a processor, that calculates a path velocity vector which is a velocity component vector of the probe along the path;
a push direction component calculator, implemented by a processor, that detects a deflection of the probe toward the workpiece, and calculates a push correction vector which is a velocity component vector to be used for correcting the deflection to a prescribed reference deflection;
a locus correction component calculator, implemented by a processor, that detects an amount and a direction of locus deviation of the probe from the path, and calculates a locus correction vector which is a velocity component vector to be used for returning the probe position to the path based on a current position of the probe and the path;
a velocity synthesizer, implemented by a processor, that calculates a velocity synthesis vector by combining the path velocity vector, the push correction vector, and the locus correction vector; and
a drive controller, implemented by a processor, that moves the probe according to the velocity synthesis vector,
wherein the push direction component calculator calculates the push correction vector using a normal direction of the workpiece at a position where the stylus tip is in contact with the surface of the workpiece as a push direction.

2. The shape measuring apparatus according to claim 1 , wherein:
the velocity synthesizer corrects the path velocity vector by multiplying the path velocity vector by a path direction gain, and calculates a velocity synthesis vector based on a corrected path velocity vector, the push correction vector, and the locus correction vector; and
the path direction gain is set smaller when the difference between the deflection and the reference deflection is larger than a prescribed first threshold value and the locus deviation amount is larger than a prescribed second threshold value than when at least one of a condition that the difference is smaller than the first threshold value and a condition that the locus deviation amount is smaller than the second threshold value is satisfied.

3. The shape measuring apparatus according to claim 1 , wherein:
the velocity synthesizer corrects the push correction vector by multiplying a push direction correction gain, and calculates a velocity synthesis vector based on the path velocity vector, a corrected push correction vector, and the locus correction vector; and
the push direction correction gain is set smaller when the difference between the deflection and the reference deflection is smaller than or equal to a prescribed first threshold value than when the difference is larger than the first threshold value.

4. The shape measuring apparatus according to claim 1 , wherein:
the velocity synthesizer corrects the locus correction vector by multiplying the locus correction vector by a locus correction gain, and calculates a velocity synthesis vector based on the path velocity vector, the push correction vector, and a corrected locus correction vector; and
the locus correction gain is set smaller when the locus deviation amount is smaller than or equal to a prescribed second threshold value than when the locus deviation amount is larger than the second threshold value.

Assignees

• Mitutoyo Corp

Inventors

• Noda Takashi
• Deguchi Hiromi

Classifications

• G05B19/041 Primary

  Function-oriented details · CPC title

• G05B19/401

  characterised by control arrangements for measuring, e.g. calibration and initialisation, measuring workpiece for machining purposes (G05B19/19 takes precedence) · CPC title

• G01B21/04 Primary

  by measuring coordinates of points · CPC title

• Y02P90/02

  Total factory control, e.g. smart factories, flexible manufacturing systems [FMS] or integrated manufacturing systems [IMS] · CPC title

• G05B2219/37043

  Touch probe, store position of touch point on surface · CPC title