Magnetic resonance examination with instrument detection

Patent metadata

Field	Value
Publication number	US-9297870-B2
Application number	US-201113700137-A
Country	US
Kind code	B2
Filing date	May 19, 2011
Priority date	May 27, 2010
Publication date	Mar 29, 2016
Grant date	Mar 29, 2016

Abstract

An magnetic resonance examination system for examination of an object comprises an RF system to generate an RF transmission field and gradient system to generate temporary magnet gradient fields. A control module includes a sequence controller to control the RF system and the gradient system to produce acquisition sequences including RF pulses and magnetic gradient pulses to generate magnetic resonance signals. The sequence controller is configured to produce an detection scan including a steady state gradient echo acquisition sequence to generate steady state gradient echo signals and an RF spoiled echo acquisition sequence to produce RF spoiled echo signals. The control module further including an analysis unit to compare the gradient echo signals to the RF spoiled echo signals and for detection of an instrument in the object from the comparison of the gradient echoes and the RF spoiled echoes.

First claim

The invention claimed is:

1. A magnetic resonance examination system for examination of an object comprising:
a RF system to generate a RF transmission field in an examination space configured to receive an object to be examined,
a gradient system to generate temporary magnetic gradient fields in the examination space,
a control module including a sequence controller configured to control the RF system and the gradient system to produce RF pulses and magnetic gradient pulses to generate magnetic resonance signals, wherein
the sequence controller is configured to apply a steady state FFE gradient echo acquisition sequence to the object in the examination space to produce steady state FFE gradient echo signals from the object and a T 1 -FFE echo acquisition sequence to the object in the examination space to produce T 1 -FFE echo signals from the object,
the control module further including an analysis unit configured to detect a difference in the FFE gradient echo signals and the T 1 -FFE echo signals and
determine whether a metal instrument is present in the object from the difference in the FFE gradient echo signals and the T 1 -FFE echo signals.

2. The magnetic resonance examination system as claimed in claim 1 , wherein the FFE acquisition sequence and the T 1 -FFE acquisition sequence are applied in magnetic resonance scan with a flip angle below 10°.

3. The magnetic resonance examination system as claimed in claim 1 , wherein the analysis unit is configured to subtract one of:
twice the FFE gradient echo signal from the T 1 -FFE echo signal, or
the T 1 -FFE echo signal generated at a preset flip angle and the T 1 -FFE echo signal generated at twice the preset flip angle or
the RF T 1 -FFE signal and the FFE gradient echo signal acquired at a flip angle equal to the Ernst angle.

4. A method of examining an object, the method including:
applying a steady state FFE gradient echo acquisition sequence to the object in an examination space to produce steady state FFE gradient echo signals from the object,
applying a T 1 -FFE echo acquisition sequence to the object in the examination space to produce T 1 -FFE echo signals from the object,
detecting a difference in the FFE gradient echo signals and the T 1 -FFE echo signals, and
detecting whether a metal object is present in the object from the difference in the FFE gradient echo signals and the T 1 -FFE echo signals.

5. A non-transitory computer-readable medium containing machine executable instructions for execution by a controller, wherein the machine executable instructions comprise instructions for:
applying a steady state FFE gradient echo acquisition sequence to an object in an examination space to produce steady state FFE gradient echo signals from the object,
applying a T 1 -FFE echo acquisition sequence to the object in the examination space to produce T 1 -FFE echo signals from the object,
detecting a difference in the FFE gradient echo signals and the T 1 -FFE echo signals, and
detecting whether a metal object is present in the object from the difference in the FFE gradient echo signals and the T 1 -FFE signals.

Assignees

• Van Den Brink Johan Samuel
• Koninkl Philips Nv

Inventors

• Van Den Brink Johan Samuel

Classifications

• G01R33/54

  Signal processing systems, e.g. using pulse sequences {; Generation or control of pulse sequences; Operator console} · CPC title

• G01R33/3852 Primary

  Gradient amplifiers; means for controlling the application of a gradient magnetic field to the sample, e.g. a gradient signal synthesizer · CPC title

• G01R33/285 Primary

  Invasive instruments, e.g. catheters or biopsy needles, specially adapted for tracking, guiding or visualization by NMR · CPC title

• G01R33/5613

  Generating steady state signals, e.g. low flip angle sequences [FLASH] · CPC title

• G01R33/288

  Provisions within MR facilities for enhancing safety during MR, e.g. reduction of the specific absorption rate [SAR], detection of ferromagnetic objects in the scanner room · CPC title