Voltage measurement and wireless communication system
US-2018180648-A1 · Jun 28, 2018 · US
US9297834B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9297834-B2 |
| Application number | US-85649110-A |
| Country | US |
| Kind code | B2 |
| Filing date | Aug 13, 2010 |
| Priority date | Aug 13, 2010 |
| Publication date | Mar 29, 2016 |
| Grant date | Mar 29, 2016 |
A practical reading order for non-experts. Skip the full description unless you need deep technical detail.
What the patent document calls the invention.
A short plain-language summary of the technical disclosure.
Who owns or filed the patent and who is credited as inventor.
Filing, priority, publication, and grant dates set the timeline.
The legal scope of protection — read this for what is actually claimed.
Technology tags used to group this patent with similar filings.
Prior art links and similar publications in this corpus.
Official abstract text for this publication.
Embodiments of the invention include devices and methods for searching IQ-based time-domain traces for events, marking the events, and analyzing intervals of interest at or around the events on a display unit of a test and measurement instrument. The test and measurement instrument can include an input terminal to receive an RF signal, an ADC to digitize the RF signal, a digital downconverter to produce I (in-phase) and Q (quadrature) baseband component information from the digitized RF signal, an acquisition memory to acquire and store a record, a trace generation section to generate one or more IQ-based time-domain traces, and a search unit to scan the IQ-based time-domain traces for one or more events. The search unit can locate and mark the events for display on a display unit of the test and measurement instrument.
Opening claim text (preview).
What is claimed is: 1. A test and measurement instrument, comprising: an input terminal configured to receive a radio frequency signal under test; an analog-to-digital converter (ADC) configured to digitize the signal under test; a digital downconverter configured to produce I (in-phase) and Q (quadrature) baseband component information from the digitized signal; an acquisition memory configured to store one or more records of the digitized I and Q baseband component information associated with the digitized signal; a trace generation section configured to generate one or more types of IQ-based time-domain data using the I and Q baseband component information stored in the acquisition memory, generate one or more IQ-based time-domain traces based on the IQ-based time-domain data, and generate individual traces of the I and Q baseband component information; and a search unit configured to scan the one or more types of IQ-based time-domain data generated using the I and Q baseband component information stored in the acquisition memory for one or more events and directly scan the individual trace of the I baseband component information or the individual trace of the Q baseband component information for one or more events. 2. The test and measurement instrument of claim 1 , wherein: the search unit is configured to locate and mark the one or more events in the one or more IQ-based time-domain traces. 3. The test and measurement instrument of claim 1 , further comprising a display unit adapted to display an interval of interest at or around the one or more events. 4. The test and measurement instrument of claim 1 , wherein: the one or more IQ-based time-domain traces include a frequency-versus-time trace; the search unit is configured to locate and mark the one or more events in the frequency-versus-time trace; and the display unit is adapted to display the interval of interest at or around the one or more marked events in the frequency-versus-time trace. 5. The test and measurement instrument of claim 1 , wherein: the one or more IQ-based time-domain traces include a phase-versus-time trace; the search unit is configured to locate and mark the one or more events in the phase-versus-time trace; and the display unit is adapted to display the interval of interest at or around the one or more events in the phase-versus-time trace. 6. The test and measurement instrument of claim 1 , wherein: the one or more IQ-based time-domain traces include a power-versus-time trace; the search unit is configured to locate and mark the one or more events in the power-versus-time trace; and the display unit is adapted to display the interval of interest at or around the one or more events in the power-versus-time trace. 7. The test and measurement instrument of claim 1 , wherein the search unit is configured to scan the one or more records for one or more events in which the one or more IQ-based time-domain traces jump to an illegal state. 8. A method of searching for events in IQ-based time-domain traces, the method comprising: receiving a radio frequency signal under test at a terminal of an oscilloscope; digitizing the signal under test using an analog-to-digital converter (ADC); downconverting the digitized signal and producing I (in-phase) and Q (quadrature) baseband component information; acquiring and storing a record of the I and Q baseband component information associated with the signal in an acquisition memory; generating one or more types of IQ-based time-domain data using the I and Q baseband component information stored in the acquisition memory; generating one or more IQ-based time-domain traces based on the IQ-based time-domain data including generating individual traces of the I and Q baseband component information; searching the one or more types of IQ-based time-domain data generated using the I and Q baseband component information stored in the acquisition memory for one or more events including directly scanning the individual trace of the I baseband component information or the individual trace of the Q baseband component information for one or more events; marking the one or more events; and displaying an interval of interest at or around the one or more marked events associated with the one or more IQ-based time-domain traces. 9. The method of claim 8 , wherein the one or more IQ-based time-domain traces include a frequency-versus-time trace. 10. The method of claim 9 , wherein searching further includes: searching the frequency-versus-time trace for the one or more events; marking the one or more events in the frequency-versus-time trace; and displaying the interval of interest at or around the one or more marked events in the frequency-versus-time trace. 11. The method of claim 8 , wherein the one or more IQ-based time-domain traces include a phase-versus-time trace. 12. The method of claim 11 , wherein searching further includes: searching the phase-versus-time trace for the one or more events; marking the one or more events in the phase-versus-time trace; and displaying the interval of interest at or around the one or more marked events in the phase-versus-time trace. 13. The method of claim 8 , wherein the one or more IQ-based time-domain traces include a power-versus-time trace. 14. The method of claim 13 , wherein searching further includes: searching the power-versus-time trace for the one or more events; marking the one or more events in the power-versus-time trace; and displaying the interval of interest at or around the one or more marked events in the power-versus-time trace. 15. The method of claim 8 , wherein the one or more IQ-based time-domain traces include demodulated data. 16. The method of claim 15 , wherein searching further includes: searching the demodulated data for the one or more events; marking the one or more events in the demodulated data; and displaying the interval of interest at or around the one or more marked events in the demodulated data. 17. An article drawn from the set including floppy disks, optical disks, fixed disks, volatile memory, non-volatile memory, random access memory, read-only memory, or flash memory, comprising a machine-accessible medium having associated instructions that, when executed in a test and measurement device, results in a machine performing the steps of claim 8 .
Circuits therefor · CPC title
for presentation of more than one variable · CPC title
for sampling · CPC title
Related publications grouped by family.
Answers are generated from the same data shown on this page.