Chemically amplified positive resist composition and resist pattern forming process
US-12164231-B2 · Dec 10, 2024 · US
US9291893B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9291893-B2 |
| Application number | US-201113281145-A |
| Country | US |
| Kind code | B2 |
| Filing date | Oct 25, 2011 |
| Priority date | Oct 26, 2010 |
| Publication date | Mar 22, 2016 |
| Grant date | Mar 22, 2016 |
A practical reading order for non-experts. Skip the full description unless you need deep technical detail.
What the patent document calls the invention.
A short plain-language summary of the technical disclosure.
Who owns or filed the patent and who is credited as inventor.
Filing, priority, publication, and grant dates set the timeline.
The legal scope of protection — read this for what is actually claimed.
Technology tags used to group this patent with similar filings.
Prior art links and similar publications in this corpus.
Official abstract text for this publication.
A resist composition contains; a resin having a structural unit represented by the formula (aa) and a structural unit represented by the formula (ab); and an acid generator, wherein R aa1 represents a hydrogen atom and a methyl group; A aa1 represents an optionally substituted C 1 to C 6 alkanediyl group etc.; R aa2 represents an optionally substituted C 1 to C 18 aliphatic hydrocarbon group; R ab1 represents a hydrogen atom and a methyl group; A ab1 represents a single bond, an optionally substituted C 1 to C 6 alkanediyl group etc.; W 1 represents an optionally substituted C 4 to C 24 alicyclic hydrocarbon group; n represents 1 or 2; A ab2 in each occurrence independently represents an optionally substituted C 1 to C 6 aliphatic hydrocarbon group; R ab2 in each occurrence independently represents a C 1 to C 12 fluorinated alkyl group.
Opening claim text (preview).
What is claimed is: 1. A resist composition comprising; a resin having a structural unit represented by the formula (aa) and a structural unit represented by the formula (ab); and an acid generator, wherein R aa1 represents a hydrogen atom or a methyl group; A aa1 represents an optionally substituted C 1 to C 6 alkanediyl group or a group represented by the formula (a-1); wherein s represents 0 or 1; X 10 and X 11 independently represents an oxygen atom, a carbonyl group, a carbonyloxy group or an oxycarbonyl group; A 10 , A 11 and A 12 independently represent an optionally substituted C 1 to C 5 aliphatic hydrocarbon group; * represents a bond to —O—C(O)—R aa2 ; R aa2 represents a perfluoro C 1 to C 18 aliphatic hydrocarbon group; wherein R ab1 represents a hydrogen atom or a methyl group; A ab1 represents a single bond, an optionally substituted C 1 to C 6 alkanediyl group or a group represented by the formula (a-2); wherein t represents 0 or 1; X 30 and X 31 independently represents an oxygen atom, a carbonyl group, a carbonyloxy group or an oxycarbonyl group; A 30 and A 31 independently represent an optionally substituted C 1 to C 5 aliphatic hydrocarbon group; A 32 represents an optionally substituted C 1 to C 5 aliphatic hydrocarbon group or a single bond; * represents a bond to W 1 ; wherein —W 1 -(A ab2 -R ab2 ) n is a group represented by the formula (W 1 -1) or a group represented by the formula (W 1 -2); wherein one or more —CH 2 — contained in the adamantane ring may be replaced by —O— or —CO—; one or more hydrogen atom contained in the adamantane ring may be replaced by a hydroxy group, a C 1 to C 12 alkyl group, a C 1 to C 12 alkoxy group, a C 3 to C 12 alicyclic hydrocarbon group or a C 6 to C 10 aromatic hydrocarbon group; provided that a total carbon number of the adamantane ring and its substituent is 36 or less; * represents a bond to A ab1 ; A ab2 in each occurrence independently represents an optionally substituted C 1 to C 6 aliphatic hydrocarbon group, and one or more —CH 2 — contained in the aliphatic hydrocarbon group may be replaced by —O— or —CO—; R ab2 in each occurrence independently represents a C 1 to C 12 fluorinated alkyl group, and one or more hydrogen atom contained in the fluorinated alkyl group may be replaced by a hydroxy group or a hydroxymethyl group; and n represents 1 or 2; wherein one or more —CH 2 — contained in the cyclohexane ring may be replaced by —O— or —CO—; one or more hydrogen atom contained in the cyclohexane ring may be replaced by a hydroxy group, a C 1 to C 12 alkyl group, a C 1 to C 12 alkoxy group, a C 3 to C 12 alicyclic hydrocarbon group or a C 6 to C 10 aromatic hydrocarbon group; provided that a total carbon number of the cyclohexane ring and its substituent is 36 or less; * represents a bond to A ab1 ; and A ab2 , R ab2 and n have the same definition of the above. 2. The resist composition according to claim 1 , wherein A aa1 of the formula (aa) is a C 1 to C 6 alkanediyl group. 3. The resist composition according to claim 1 , wherein A aa1 of the formula (aa) is an ethylene group. 4. The resist composition according to claim 1 , wherein the acid generator is an acid generator represented by the formula (B1); wherein Q 1 and Q 2 independently represent a fluorine atom or a C 1 to C 6 perfluoroalkyl group; L b1 represents an optionally substituted C 1 to C 17 divalent aliphatic hydrocarbon group, and one or more —CH 2 — contained in the aliphatic hydrocarbon group may be replaced by —O— or —CO—; Y represents an optionally substituted C 1 to C 18 aliphatic hydrocarbon group, and one or more —CH 2 — contained in the aliphatic hydrocarbon group may be replaced by —O—, —CO— or —SO 2 —; and Z + represents an organic cation. 5. The resist composition according to claim 4 , wherein Y of the formula (B1) is an optionally substituted C 3 to C 18 alicyclic hydrocarbon group. 6. The resist composition according to claim 1 , further comprising a resin which is insoluble or poorly soluble in aqueous alkali solution, but becomes soluble in aqueous alkali solution by the action of acid. 7. The resist composition according to claim 1 , further comprising a solvent. 8. A method for producing a resist pattern comprising steps of; (1) applying the resist composition according to claim 1 onto a substrate; (2) drying the applied composition to form a composition layer; (3) exposing the composition layer; (4) heating the exposed composition layer; and (5) developing the heated composition layer.
with organic non-macromolecular light-sensitive compounds not otherwise provided for, e.g. dissolution inhibitors · CPC title
in the presence of a fluid, e.g. immersion; using fluid cooling means · CPC title
with perfluoro compounds, e.g. for dry lithography (G03F7/0048 takes precedence) · CPC title
the macromolecular compound having an alicyclic moiety in a side chain · CPC title
Related publications grouped by family.
Answers are generated from the same data shown on this page.