Light Emitting Diode Epitaxial Structure and Light Emitting Diode
US-2024297271-A1 · Sep 5, 2024 · US
US9287455B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9287455-B2 |
| Application number | US-201414184741-A |
| Country | US |
| Kind code | B2 |
| Filing date | Feb 20, 2014 |
| Priority date | Sep 22, 2011 |
| Publication date | Mar 15, 2016 |
| Grant date | Mar 15, 2016 |
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A carbon doped short period superlattice is provided. A heterostructure includes a short period superlattice comprising a plurality of quantum wells alternating with a plurality of barriers. One or more of the quantum wells and/or the barriers includes a carbon doped layer (e.g., a non-percolated or percolated carbon atomic plane).
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What is claimed is: 1. A group III nitride semiconductor heterostructure comprising: a short period superlattice comprising a plurality of quantum wells alternating with a plurality of barriers, wherein the plurality quantum wells comprise a semiconductor material having a first band gap and the plurality of barriers comprise a semiconductor material having a second band gap wider than the first band gap, and wherein at least one of: the plurality of quantum wells or the plurality of barriers includes a carbon doped layer including a plurality of openings. 2. The heterostructure of claim 1 , wherein the carbon doped layer comprises at least one monolayer graphene domain. 3. The heterostructure of claim 1 , wherein the carbon doped layer comprises a multilayer stack of monolayer graphene domains. 4. The heterostructure of claim 1 , wherein the carbon doped layer is doped with a dopant. 5. The heterostructure of claim 4 , wherein a dopant of the carbon doped layer is selected from the group consisting of: magnesium, fluorine, gold, aromatic molecules, and polar molecules. 6. The heterostructure of claim 1 , wherein the short period superlattice is formed from a nitride-based material, and wherein the short period superlattice is included in the heterostructure for p-type conduction. 7. The heterostructure of claim 1 , wherein the heterostructure is configured to operate as a light emitting structure. 8. The heterostructure of claim 7 , wherein the light emitting structure is a deep ultraviolet light emitting structure. 9. The heterostructure of claim 1 , wherein each of the plurality of quantum wells includes at least one carbon doped layer and wherein none of the plurality of barriers includes a carbon doped layer. 10. The heterostructure of claim 1 , wherein each of the plurality of barriers includes at least one carbon doped layer and wherein none of the plurality of quantum wells includes a carbon doped layer. 11. The heterostructure of claim 1 , wherein the carbon doped layer is a non-percolated carbon doped layer. 12. A group III nitride semiconductor light emitting device comprising: a short period superlattice comprising a plurality of quantum wells alternating with a plurality of barriers, wherein the plurality quantum wells comprise a semiconductor material having a first band gap and the plurality of barriers comprise a semiconductor material having a second band gap wider than the first band gap, and wherein at least one of: the plurality of quantum wells or the plurality of barriers includes a carbon doped layer including a plurality of openings. 13. The device of claim 12 , wherein the carbon doped layer comprises at least one monolayer graphene domain. 14. The device of claim 13 , wherein the carbon doped layer comprises a multilayer stack of monolayer graphene domains. 15. The device of claim 12 , wherein the short period superlattice is a light generating structure of the device. 16. The device of claim 12 , wherein the device is a vertically conducting light emitting device including: a p-type contact on a first side of the device; and an n-type contact on a second side of the device opposite the first side. 17. The device of claim 16 , wherein at least one of: the p-type contact or the n-type contact includes the short period superlattice. 18. The device of claim 12 , wherein the carbon doped layer is a non-percolated carbon doped layer. 19. A method comprising: fabricating a group III nitride semiconductor heterostructure, the fabricating including forming a short period superlattice comprising a plurality of quantum wells alternating with a plurality of barriers, wherein the plurality quantum wells comprise a semiconductor material having a first band gap and the plurality of barriers comprise a semiconductor material having a second band gap wider than the first band gap, and wherein at least one of: the plurality of quantum wells or the plurality of barriers includes a carbon doped layer including a plurality of openings. 20. The method of claim 19 , further comprising fabricating a vertically conducting light emitting diode, wherein the fabricating the vertically conducting light emitting diode includes the fabricating the heterostructure, wherein the vertically conducting light emitting diode is configured to emit deep ultraviolet light. 21. The method of claim 20 , wherein the fabricating the vertically conducting light emitting diode further includes removing a substrate from the heterostructure. 22. The method of claim 20 , wherein fabricating at least one of: an n-type contact or a p-type contact for the vertically conducting light emitting diode includes the fabricating the heterostructure. 23. The method of claim 19 , wherein the carbon doped layer is a non-percolated carbon doped layer.
characterised by crystalline imperfections, e.g. dislocations; characterised by the distribution of dopants, e.g. delta-doping · CPC title
having carrier transport control structures, e.g. highly-doped semiconductor layers or current-blocking structures · CPC title
having reflecting means, e.g. semiconductor Bragg reflectors · CPC title
within the light-emitting regions, e.g. having quantum confinement structures · CPC title
having quantum effect structures or superlattices, e.g. tunnel junctions · CPC title
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