Abnormality monitoring system and image forming apparatus

Patent metadata

Field	Value
Publication number	US-9285746-B2
Application number	US-201414447544-A
Country	US
Kind code	B2
Filing date	Jul 30, 2014
Priority date	Aug 6, 2013
Publication date	Mar 15, 2016
Grant date	Mar 15, 2016

Abstract

An abnormality monitoring system includes: an electronic component that outputs a lock signal of “High” when the electronic component stops functioning and outputs a lock signal of “Low” when the electronic component functions; a signal device that supplies power to the electronic component and outputs an ON operation signal instructing the electronic component to function and an OFF operation signal instructing the electronic component to stop functioning; a harness member that connects the electronic component and the signal device and transmits and receives a signal; and a monitor device that determines abnormality of the electronic component when the operation signal is ON and the lock signal is “Low”, and determines abnormality of the harness member when the operation signal is OFF and the lock signal is “Low”.

First claim

What is claimed is:

1. An abnormality monitoring system comprising:
an electronic component that outputs a lock signal of “High” when the electronic component stops functioning and outputs a lock signal of “Low” when the electronic component functions;
a signal device that supplies power to the electronic component and outputs an ON operation signal instructing the electronic component to function and an OFF operation signal instructing the electronic component to stop functioning;
a harness member that connects the electronic component and the signal device and transmits and receives a signal; and
a monitor device that determines abnormality of the electronic component when the operation signal is ON and the lock signal is “High”, and determines abnormality of the harness member when the operation signal is OFF and the lock signal is “Low”.

2. The abnormality monitoring system according to claim 1 , wherein the monitor device determines the normality of the electronic component when the operation signal is OFF and the lock signal is “High”.

3. The abnormality monitoring system according to claim 1 , wherein the monitor device is connected to the harness member for each of a plurality of electronic components.

4. An image forming apparatus comprising:
a plurality of drive motors each of which outputs a lock signal of “High” when it stops and output a lock signal of “Low” when it is driven;
a signal device that supplies power to the drive motors and outputs ON operation signals instructing to drive the drive motors and OFF operation signals instructing to stop the drive motors;
harness members that connect the drive motors and the signal device and transmit and receive signals; and
a monitor device that determines normality and abnormality of a drive motor and a harness member based on a combination of an operation signal and a lock signal associated therewith, wherein the monitor device:
determines that the drive motor is operating normally when the operation signal is ON and the lock signal is “Low”,
determines abnormality of the harness member when the operation signal is OFF and the lock signal is “Low”,
determines that the drive motor is operating abnormally when the operation signal is ON and the lock signal is “High”, and
determines that the drive motor is operating normally when the operation signal is OFF and the lock signal is “High”.

Assignees

• Konishi Takahiro
• Morita Yoshiaki
• Ricoh Co Ltd

Inventors

• Konishi Takahiro
• Morita Yoshiaki

Classifications

• G03G15/55 Primary

  Self-diagnostics; Malfunction or lifetime display · CPC title

• G03G15/5004

  Power supply control, e.g. power-saving mode, automatic power turn-off · CPC title

• G01R31/00

  Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere ({measuring superconductive properties G01R33/1238;} testing line transmission systems H04B3/46; testing or measuring semiconductors or solid state devices during manufacture {H10P74/00}) · CPC title