Systems and methods for stand-off inspection of aircraft structures

US9285296B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9285296-B2
Application numberUS-201313732789-A
CountryUS
Kind codeB2
Filing dateJan 2, 2013
Priority dateJan 2, 2013
Publication dateMar 15, 2016
Grant dateMar 15, 2016

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  1. Title

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  5. First independent claim

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Abstract

Official abstract text for this publication.

A system for stand-off inspection comprising local positioning system hardware and a nondestructive evaluation instrument supported by a pan-tilt mechanism. The system further comprises a computer system that is programmed to perform the following operations: (a) directing the local positioning system hardware toward an area of a surface on a target object by control of the pan-tilt mechanism; (b) activating the local positioning system hardware to acquire an image; (c) processing the image to determine whether an anomaly is present in the area; (d) if an anomaly is present, determining coordinates of a position of the anomaly in a coordinate system of the target object; and (e) directing the nondestructive evaluation instrument toward a position corresponding to the coordinates. Optionally, the computer system is further programmed to measure one or more characteristics of the anomaly.

First claim

Opening claim text (preview).

The invention claimed is: 1. A system comprising: a support; a pan-tilt mechanism mounted to said support; an assembly mounted to said pan-tilt mechanism, said assembly comprising a camera and a nondestructive evaluation instrument which are affixed to each other; and a computer system programmed to execute the following operations: (a) controlling said pan-tilt mechanism to determine a direction vector to a target object; (b) controlling said camera to acquire image data representing an image of an area on a surface of the target object which is intersected by the direction vector; (c) processing the image data to determine whether the image of the area includes information indicating presence of an anomaly in the area; (d) if it is determined in operation (c) that the image data includes information indicating the presence of an anomaly in the area, determining coordinates of a position of the anomaly relative to a coordinate system of the target object based on the image data; (e) controlling said pan-tilt mechanism to direct said nondestructive evaluation instrument toward an area on the target object having said coordinates; and (f) controlling said nondestructive evaluation instrument to acquire nondestructive evaluation measurement data from said area on the target object having said coordinates using a stand-off nondestructive evaluation technique. 2. The system as recited in claim 1 , wherein said computer system is further programmed to process the nondestructive evaluation measurement data to determine a value for a first characteristic of the anomaly. 3. The system as recited in claim 2 , wherein said computer system is further programmed to process the image data to determine a value for a second characteristic of the anomaly. 4. The system as recited in claim 3 , wherein the anomaly is a crack, the first characteristic is a depth of the crack, and the second characteristic is a length of the crack. 5. The system as recited in claim 3 , further comprising image analysis software resident in said computer system, wherein said computer is programmed to use said image analysis software to determine the position of the anomaly relative to the coordinate system of the target object and then determine the second characteristic of the anomaly. 6. The system as recited in claim 1 , further comprising a laser pointer and three-dimensional localization software resident in said computer system, wherein said computer is programmed to control said laser pointer and use said three-dimensional localization software to determine a position and an orientation of said pan-tilt mechanism relative to the coordinate system of the target object based on light transmitted by said laser pointer and returned by the target object. 7. The system as recited in claim 1 , wherein said nondestructive evaluation instrument is selected from the following group: a terahertz camera with lensing, a near-infrared spectrograph with lensing for distance measurement, a thermal imaging camera, microwave imaging, x-ray backscatter imaging, a shearographic measurement system, lasers to generate and detect ultrasonic waves, and a laser scanning vibrometer. 8. The system as recited in claim 6 , wherein said computer system is further programmed to control said laser pointer to direct a laser beam toward said area on the target object having said recorded coordinates in response to a user input. 9. The system as recited in claim 1 , wherein said computer system is further programmed to receive coordinate positions of features on the surface of the target object from a three-dimensional database of feature positions and then control said pan-tilt mechanism to move a line of sight of said camera across the surface, stopping at each of said coordinate positions of said features to acquire image data. 10. A method for stand-off inspection comprising: (a) acquiring position measurement data representing the position of an area on a surface of a target object relative to a coordinate system of the target object using a local positioning system; (b) rotating an assembly comprising a camera affixed to a nondestructive evaluation instrument so that the camera is directed toward the area; (c) acquiring image data representing the area; (d) processing the image data to determine whether the image data includes information indicating the presence of an anomaly in the area; (e) if it is determined in step (d) that the image data includes information indicating the presence of an anomaly in the area, determining coordinates of a position of the anomaly relative to the coordinate system of the target object based on the image data; (f) recording said coordinates of the position of the anomaly; (g) rotating the assembly so that the nondestructive evaluation instrument is directed toward an area on the target object having said recorded coordinates; and (h) acquiring nondestructive evaluation measurement data using a stand-off nondestructive evaluation technique. 11. The method as recited in claim 10 , further comprising processing the nondestructive evaluation measurement data to determine a value for a first characteristic of the anomaly. 12. The method as recited in claim 11 , further comprising processing the image data to determine a value for a second characteristic of the anomaly. 13. The method as recited in claim 12 , wherein the anomaly is a crack, the first characteristic is a depth of the crack, and the second characteristic is a length of the crack. 14. The method as recited in claim 12 , further comprising using image analysis software to determine the position of the anomaly relative to the coordinate system of the target object and then determine the second characteristic of the anomaly. 15. The method as recited in claim 10 , wherein the target object is an aircraft and the anomaly is damage to the aircraft. 16. The method as recited in claim 15 , wherein the area corresponds to a location of a dielectric top on a wing of the aircraft. 17. The method as recited in claim 10 , further comprising using three-dimensional localization software to determine a position and an orientation of the camera relative to the coordinate system of the target object. 18. The method as recited in claim 10 , wherein said nondestructive evaluation technique is selected from the following group: near-infrared spectroscopy, terahertz imaging, stand-off infrared thermography, laser shearography, laser ultrasonic testing and laser vibrometry. 19. The method as recited in claim 10 , further comprising directing a laser beam toward said area on the target object having said recorded coordinates. 20. The method as recited in claim 10 , further comprising receiving coordinate positions of features on the surface of the target object from a three-dimensional database of feature positions and then rotating the assembly so that the camera scans across the surface, stopping at each of said coordinate positions of said features to acquire image data. 21. A method for detecting and determining a position of a visible anomaly on a target object, said method comprising: (a) locating, by position and orientation, a local positioning system comprising a camera having a nondestructive evaluation instrument affixed thereto with respect to a target object; (b) determining the position and orientation offset between the position and orientation of the local positioning system located in step (a) and a prior position and orientation of a local positioning sys

Assignees

Inventors

Classifications

  • G01M99/00Primary

    Subject matter not provided for in other groups of this subclass · CPC title

  • Investigating thin films, e.g. matrix isolation method · CPC title

  • using sequentially two or more inspection runs, e.g. coarse and fine, or detecting then analysing · CPC title

  • Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges (G01N21/8806 and G01N21/93 - G01N21/95692 take precedence; optical measurement of dimensions G01B11/00; optical scanning G02B26/10; image transformation G06T3/00; computerised image enhancement G06T5/00; image processing per se for flaw detection G06T7/0002) · CPC title

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What does patent US9285296B2 cover?
A system for stand-off inspection comprising local positioning system hardware and a nondestructive evaluation instrument supported by a pan-tilt mechanism. The system further comprises a computer system that is programmed to perform the following operations: (a) directing the local positioning system hardware toward an area of a surface on a target object by control of the pan-tilt mechanism; …
Who is the assignee on this patent?
Boeing Co
What technology area does this patent fall under?
Primary CPC classification G01M99/00. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Mar 15 2016 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).