Methods and systems for the rapid detection of concealed objects

Patent metadata

Field	Value
Publication number	US-9268058-B2
Application number	US-201414165177-A
Country	US
Kind code	B2
Filing date	Jan 27, 2014
Priority date	Sep 15, 2003
Publication date	Feb 23, 2016
Grant date	Feb 23, 2016

Abstract

The present invention provides for an improved scanning process having microwave arrays comprised of microwave transmitters in radiographic alignment with microwave receivers. The microwave array emits controllably directed microwave radiation toward an object under inspection. The object under inspection absorbs radiation in a manner dependent upon its metal content. The microwave radiation absorption can be used to generate a measurement of metal content. The measurement, in turn, can be used to calculate at least a portion of the volume and shape of the object under inspection. The measurement can be compared to a plurality of predefined threats. The microwave screening system is used in combination with other screening technologies, such as NQR-based screening, X-ray transmission based screening, X-ray scattered based screening, or Computed Tomography based screening.

First claim

We claim:

1. An apparatus for inspecting a container comprising:
a first stage inspection system having an X-ray projection system configured to generate a first set of data;
a processor in data communication with the first stage inspection system wherein the processor processes said first set of data and wherein said first set of data is indicative of a target region;
a second stage inspection system for generating an inspection region encompassing the target region wherein the second stage inspection system produces a second set of data; and
the processor configured to execute a neural network to process the second set of data to determine an existence of a threat.

2. The apparatus of claim 1 wherein the neural network is configured to operate as a back-propagation network having a plurality of nodes and wherein said nodes are organized in a series of successive layers, each layer comprising at least one node that receives inputs from nodes in a prior layer and transmits outputs to nodes in a subsequent layer.

3. The apparatus of claim 2 wherein nodes in a first layer are weighted in accordance with their distance from at least one node in a second layer.

4. The apparatus of claim 1 wherein the neural network is configured to determine the existence of the threat using a plurality of libraries, wherein the libraries comprise at least one of a threat library, a non-threat library, and a buffer library.

5. The apparatus of claim 1 wherein the X-ray projection system comprises at least two X-ray projection systems and wherein the processor in data communication with the first stage inspection system is configured to generate a first image and a second image.

6. The apparatus of claim 1 wherein the second stage inspection system further comprises an energy dispersive detector and wherein the second set of data has an X-ray signature characteristic of the threat.

7. The apparatus of claim 6 wherein the energy dispersive detector is used to produce a signature of the threat.

8. The apparatus of claim 7 further comprising an array of transmission detectors, wherein the array of transmission detectors is configured to produce data defining at least one of mass, degree of attenuation, area, average atomic number, of the threat.

9. The apparatus of claim 8 wherein the array of transmission detectors comprises high energy and low energy detectors.

10. The apparatus of claim 9 further comprising a processor configured to generate a diffraction spectrum from data generated from both the high energy detectors and the low energy detectors.

11. The apparatus of claim 9 wherein the processor configured to generate a diffraction spectrum is adapted to use a reference spectrum to correct the diffraction spectrum.

12. The apparatus of claim 9 wherein the processor configured to generate a diffraction spectrum is adapted to use a reference spectrum to correct for beam hardening.

13. The apparatus of claim 5 wherein the processor in data communication with the first stage inspection system is adapted to identify the target region by selecting at least two regions associated with each of said images.

14. The apparatus of claim 13 wherein the processor in data communication with the first stage inspection system is configured to identify a first region in the first image as being similar to a second region in the second image.

15. The apparatus of claim 14 wherein the processor in data communication with the first stage inspection system identifies the first and second regions as being similar based upon at least one of mass, degree of attenuation, total area, atomic number, size, shape, and organic to inorganic ratio.

16. The apparatus of claim 15 wherein a plurality of X-ray beam projections from the two X-ray projection systems intersect the target region at an intersection area.

17. The apparatus of claim 16 wherein the processor in data communication with the first stage inspection system is adapted to determine a location of the inspection region by identifying a set of coordinates for the intersection area.

18. The apparatus of claim 17 wherein the processor in data communication with the first stage inspection system produces a plurality of control commands in response to the determination of said location of the inspection region.

19. The apparatus of claim 18 wherein the inspection region is positioned relative to the target region in response to the plurality of control commands using a three-axis control system.

Assignees

• Rapiscan Systems Inc

Inventors

• Peschmann Kristian R
• Mann Kenneth Robert

Classifications

• G01R27/06 Primary

  Measuring reflection coefficients; Measuring standing-wave ratio · CPC title

• G01V11/00 Primary

  Prospecting or detecting by methods combining techniques covered by two or more of main groups G01V1/00 - G01V9/00 · CPC title

• G01F23/284

  Electromagnetic waves · CPC title

• G01V5/0016

  Physics · mapped topic

• G01V5/0025

  Physics · mapped topic