Dynamic range enhancement of high-speed electrical signal data via non-linear compression

Patent metadata

Field	Value
Publication number	US-9264154-B1
Application number	US-201314048895-A
Country	US
Kind code	B1
Filing date	Oct 8, 2013
Priority date	Oct 9, 2012
Publication date	Feb 16, 2016
Grant date	Feb 16, 2016

Abstract

Systems and methods for high-speed compression of dynamic electrical signal waveforms to extend the measuring capabilities of conventional measuring devices such as oscilloscopes and high-speed data acquisition systems are discussed. Transfer function components and algorithmic transfer functions can be used to accurately measure signals that are within the frequency bandwidth but beyond the voltage range and voltage resolution capabilities of the measuring device.

First claim

The invention claimed is:

1. A method for measuring an electrical signal utilizing a data acquisition device, comprising the steps of:
obtaining a first analog electrical signal waveform with a probe originating from a device under test (DUT);
altering at least a portion of the first analog electrical signal waveform utilizing a transfer function component to create a second analog electrical signal waveform;
conveying the second analog electrical signal waveform to the data acquisition device;
applying an algorithmic inverse transfer function to the second analog electrical signal waveform to restore the first analog waveform; and
outputting an electrical signal measurement based on the restored first analog waveform.

2. The method for measuring an electrical signal utilizing a data acquisition device of claim 1 , wherein the electrical signal exceeds 200 kHz.

3. The method for measuring an electrical signal utilizing a data acquisition device of claim 1 , wherein altering at least a portion of the electrical signal waveform comprises compressing the electrical signal waveform that exceeds a measuring capability of the data acquisition device.

4. The method for measuring an electrical signal utilizing a data acquisition device of claim 3 , wherein the measuring capability of the data acquisition device comprises a frequency bandwidth, a sampling rate, a voltage range, a voltage resolution or an electrical impedance of the data acquisition device.

5. The method for measuring an electrical signal utilizing a data acquisition device of claim 1 , wherein the algorithmic inverse transfer function is an inverse of the transfer function component.

6. The method for measuring an electrical signal utilizing a data acquisition device of claim 1 , wherein the data acquisition device comprises an oscilloscope or DAS and outputting the restored electrical signal waveform comprises presenting the restored electrical signal waveform on a display screen of the oscilloscope or DAS.

7. The method for measuring an electrical signal utilizing a data acquisition device of claim 1 , wherein at least one of the transfer function component or the algorithmic inverse transfer function are based on a voltage range, a sampling rate, a frequency bandwidth or an electrical impedance of the data acquisition device.

8. The method for measuring an electrical signal utilizing a data acquisition device of claim 1 , wherein altering at least a portion of the electrical signal waveform comprises compressing an amplitude portion of the electrical signal waveform.

9. The method for measuring an electrical signal utilizing a data acquisition device of claim 1 , wherein the data acquisition device comprises an oscilloscope or a high-speed data acquisition system.

10. The method for measuring an electrical signal utilizing a data acquisition device of claim 1 , wherein the transfer function component is implemented utilizing the probe.

11. A system for measuring an electrical signal utilizing a data acquisition device, comprising:
a probe that obtains a first electrical signal waveform originating from a device under test (DUT) and conveys the first electrical signal waveform to the data acquisition device;
a transfer function component that alters at least a portion of the first electrical signal waveform;
an algorithmic inverse transfer function that comprises an inverse of the transfer function component and that restores the altered portion of the first electrical signal waveform.

12. The system for measuring an electrical signal utilizing a data acquisition device of claim 11 , wherein the transfer function component compresses a portion of the electrical waveform that exceeds a measuring capability of the data acquisition device.

13. The system for measuring an electrical signal utilizing a data acquisition device of claim 12 , wherein the transfer function component compresses an amplitude portion of the electrical signal waveform.

14. The system for measuring an electrical signal utilizing a data acquisition device of claim 12 , wherein the measuring capability of the data acquisition device comprises the voltage range or the voltage resolution of the data acquisition device.

15. The system for measuring an electrical signal utilizing a data acquisition device of claim 11 , wherein at least one of the transfer function component or the algorithmic inverse transfer function are based on a voltage range, frequency bandwidth or electrical impedance of the data acquisition device.

16. The system for measuring an electrical signal utilizing a data acquisition device of claim 11 , wherein the data acquisition device comprises an oscilloscope or a high-speed data acquisition system.

17. The system for measuring an electrical signal utilizing a data acquisition device of claim 11 , wherein the data acquisition device includes a display for presenting the electrical signal waveform to a user.

18. The system for measuring an electrical signal utilizing a data acquisition device of claim 11 , wherein the transfer function component is implemented utilizing the probe.

19. The system for measuring an electrical signal utilizing a data acquisition device of claim 18 , wherein the transfer function component comprises at least one of a diode, a barrier rectifier, a resistor, or a high-frequency, low-voltage operational amplifier.

20. A system for extending a measurement capability of a data acquisition device, comprising:
a first analog electrical signal waveform originating from a device under test (DUT);
a transfer function component that alters a portion of the first analog electrical signal waveform that is greater than the measurement capability of the data acquisition device that receives the first waveform;
an algorithmic inverse transfer function that comprises an inverse of the transfer function component and that restores the altered portion of the first analog waveform.

Assignees

• Laun Matthew C
• Nasa

Inventors

• Laun Matthew C

Classifications

• H04B3/46 Primary

  Monitoring; Testing · CPC title

• H04B17/00 Primary

  Monitoring; Testing (of line transmission systems H04B3/46; arrangements for monitoring or testing transmission systems employing electromagnetic waves other than radio waves H04B10/07) · CPC title

• H04B17/0085

  using test signal generators · CPC title