System for measuring light intensity distribution

US9255838B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9255838-B2
Application numberUS-201213729279-A
CountryUS
Kind codeB2
Filing dateDec 28, 2012
Priority dateJun 12, 2012
Publication dateFeb 9, 2016
Grant dateFeb 9, 2016

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

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A system for measuring intensity distribution of light includes a carbon nanotube array and an imaging element. The carbon nanotube array is placed in an environment of inert gas or a vacuum environment. The carbon nanotube array absorbs photons of a light source and radiates radiation light. The imaging element is used to image the radiation light. The carbon nanotube array is between the light source and the imaging element.

First claim

Opening claim text (preview).

What is claimed is: 1. A system for measuring intensity distribution of light comprising: a carbon nanotube array configured to absorb photons of a light source and to radiate radiation light, wherein the carbon nanotube array is in a vacuum environment, the carbon nanotube array is placed on a substrate, an entire first surface of the substrate is in contact with the carbon nanotube array, the carbon nanotube array is between the substrate and the light source, and the carbon nanotube array comprises a plurality of carbon nanotubes substantially perpendicular to the first surface of the substrate; and an imaging element spaced from the carbon nanotube array, the imaging element being configured to image the radiation light from the carbon nanotube array, wherein the light source is located on a first side of the carbon nanotube array and the imaging element is located on a second side of the carbon nanotube array opposite to the first side. 2. The system of claim 1 , wherein the plurality of carbon nanotubes is substantially parallel to each other. 3. The system of claim 1 , wherein the carbon nanotube array is further configured to absorb photons having wavelengths in ranges of infrared light, visible light or ultraviolet light emitted from the light source. 4. The system of claim 1 , further comprising a chamber made of light-transparent materials, the carbon nanotube array is in the chamber. 5. The system of claim 4 , wherein a pressure in the chamber is in a range from about 10 −9 Pa to about 10 −3 Pa. 6. The system of claim 4 , wherein the chamber is between the light source and the imaging element. 7. The system of claim 1 , wherein the carbon nanotube array comprises a top surface and a bottom surface opposite to the top surface, the top surface is nearer to the light sources than the bottom surface. 8. The system of claim 7 , wherein the carbon nanotube array is further configured so that an irradiating angle between a light beam from the light source and the top surface of the carbon nanotube array is 90 degrees. 9. The system of claim 7 , wherein the imaging element is nearer to the bottom surface than the top surface of the carbon nanotube array. 10. The system of claim 7 , wherein a distance between the imaging element and the bottom surface of the carbon nanotube array is in a range from about 1 mm to about 100 mm. 11. The system of claim 7 , wherein when the system is in operation, the top surface of the carbon nanotube array is irradiated by the photons emitted by the light source, and the carbon nanotube array radiates the radiation light; and the imaging element images the radiation light to obtain an intensity distribution of the light source. 12. The system of claim 1 , wherein the imaging element is a charge-coupled device or a complementary metal-oxide-semiconductor. 13. The system of claim 1 , wherein the carbon nanotube array is further configured so that a light beam is substantially vertical to a top surface of the carbon nanotube array and parallel to an axis of each of the plurality of carbon nanotubes. 14. The system of claim 1 , wherein the first surface of the substrate is a continuous plane. 15. A system for measuring intensity distribution of light comprising: a chamber configured to provide a vacuum environment; a carbon nanotube array comprising a plurality of carbon nanotubes substantially perpendicular to a surface of the carbon nanotube array is in the chamber, wherein the carbon nanotube array is configured to absorb photons emitted from a light source and to radiate radiation light, the carbon nanotube array is placed on a substrate, an entire first surface of the substrate is in contact with the carbon nanotube array, the carbon nanotube array is between the substrate and the light source, and the plurality of carbon nanotubes is substantially perpendicular to the first surface of the substrate; and an imaging element imaging the radiation light from the carbon nanotube array and being spaced from the chamber. 16. The system of claim 15 , wherein the chamber is made of light-transparent materials, and the carbon nanotube array is in the chamber. 17. The system of claim 16 , wherein a pressure in the chamber is in a range from about 10 −9 Pa to about 10 −3 Pa. 18. A system for measuring intensity distribution of light comprising: a carbon nanotube array comprising a plurality of carbon nanotubes substantially perpendicular to a surface of the carbon nanotube array and absorbing photons emitted from a light source and radiating radiation light, wherein the carbon nanotube array is placed on a substrate made of zinc selenide, an entire first surface of the substrate is in contact with the carbon nanotube array, the carbon nanotube array is between the substrate and the light source, and the plurality of carbon nanotubes is substantially perpendicular to the first surface of the substrate; and an imaging element imaging the radiation light from the carbon nanotube array and being spaced from the carbon nanotube array, wherein the carbon nanotube array and the imaging element are placed in a chamber with a vacuum environment, the light source is located on a first side of the carbon nanotube array and the imaging element is located on a second side of the carbon nanotube array opposite to the first side, a pressure in the chamber is in a range from about 10 −9 Pa to about 10 −3 Pa, and a distance between the imaging element and the carbon nanotube array is in a range from about 1 mm to about 100 mm.

Assignees

Inventors

Classifications

  • G01J1/0242Primary

    Control or determination of height or angle information of sensors or receivers; Goniophotometry · CPC title

  • for testing lamps or other light sources · CPC title

  • G01J1/02Primary

    Details · CPC title

  • arrangements with two or more detectors, e.g. for sensitivity compensation · CPC title

  • using luminescence generated by light · CPC title

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What does patent US9255838B2 cover?
A system for measuring intensity distribution of light includes a carbon nanotube array and an imaging element. The carbon nanotube array is placed in an environment of inert gas or a vacuum environment. The carbon nanotube array absorbs photons of a light source and radiates radiation light. The imaging element is used to image the radiation light. The carbon nanotube array is between the ligh…
Who is the assignee on this patent?
Jiang Kai-Li, Zhu Jun, Feng Chen, and 3 more
What technology area does this patent fall under?
Primary CPC classification G01J1/0242. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Feb 09 2016 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).