Epitaxial film forming method, vacuum processing apparatus, semiconductor light emitting element manufacturing method, semiconductor light emitting element, and illuminating device

US9252322B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9252322-B2
Application numberUS-201213661948-A
CountryUS
Kind codeB2
Filing dateOct 26, 2012
Priority dateApr 30, 2010
Publication dateFeb 2, 2016
Grant dateFeb 2, 2016

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  1. Title

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  2. Abstract

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  5. First independent claim

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Abstract

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The present invention provides: an epitaxial film forming method capable of fabricating a +c-polarity epitaxial film made of a Group III nitride semiconductor by sputtering; and a vacuum processing apparatus suitable for this epitaxial film forming method. In one embodiment of the present invention, a Group III nitride semiconductor thin film is epitaxially grown by sputtering on an α-Al 2 O 3 substrate heated to a desired temperature by using a heater. First, the α-Al 2 O 3 substrate is disposed on a substrate holder including the heater in such a way that the α-Al 2 O 3 substrate is disposed away from the heater by a predetermined distance. Then, an epitaxial film of a Group III nitride semiconductor thin film is formed on the α-Al 2 O 3 substrate in the state where the α-Al 2 O 3 substrate is disposed away from the heater by the predetermined distance.

First claim

Opening claim text (preview).

The invention claimed is: 1. An epitaxial film forming method of epitaxially growing a Group III nitride semiconductor thin film by sputtering on an α-Al 2 O 3 substrate heated to a desired temperature by using a heater, the method comprising: holding the α-Al 2 O 3 substrate away from a substrate facing surface of the heater by 0.5-5 mm; and forming an epitaxial film of a Group III nitride semiconductor thin film by sputtering on the α-Al 2 O 3 substrate in a state of being held away from the substrate facing surface by 0.5-5 mm, the epitaxial film having +c polarity. 2. A semiconductor light emitting element manufacturing method comprising the epitaxial film forming method according to claim 1 . 3. A semiconductor light emitting element comprising an epitaxial film of a Group III nitride semiconductor thin film fabricated by the epitaxial film forming method according to claim 1 . 4. An illuminating device comprising the semiconductor light emitting element according to claim 3 . 5. An epitaxial film forming method of forming an epitaxial film of a Group III nitride semiconductor thin film by sputtering on an α-Al 2 O 3 substrate by using a vacuum processing apparatus including: a vacuum chamber capable of vacuum pumping; a substrate holder for supporting the α-Al 2 O 3 substrate; and a heater capable of heating the α-Al 2 O 3 substrate held by the substrate holder to a desired temperature, wherein an epitaxial film of a Group III nitride semiconductor thin film is formed by sputtering on the α-Al 2 O 3 substrate in a state where the α-Al 2 O 3 substrate held by the substrate holder is held away from a substrate facing surface of the heater by 0.5-5 mm, and wherein the epitaxial film has a +c polarity. 6. The epitaxial film forming method according to claim 5 , wherein the substrate holder holds the α-Al 2 O 3 substrate in a state where the substrate holder is in contact with a surface of the α-Al 2 O 3 substrate on a lower side in a direction of gravity. 7. A semiconductor light emitting element manufacturing method comprising the epitaxial film forming method according to claim 5 . 8. A semiconductor light emitting element comprising an epitaxial film of a Group III nitride semiconductor thin film fabricated by the epitaxial film forming method according to claim 5 . 9. An illuminating device comprising the semiconductor light emitting element according to claim 8 .

Assignees

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Classifications

  • Nitrides · CPC title

  • Nitrides · CPC title

  • being crystalline insulating materials · CPC title

  • using physical deposition, e.g. vacuum deposition or sputtering · CPC title

  • within the light-emitting regions · CPC title

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What does patent US9252322B2 cover?
The present invention provides: an epitaxial film forming method capable of fabricating a +c-polarity epitaxial film made of a Group III nitride semiconductor by sputtering; and a vacuum processing apparatus suitable for this epitaxial film forming method. In one embodiment of the present invention, a Group III nitride semiconductor thin film is epitaxially grown by sputtering on an α-Al 2 O 3 …
Who is the assignee on this patent?
Canon Anelva Corp
What technology area does this patent fall under?
Primary CPC classification H10H20/01335. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Feb 02 2016 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 1 related publication on this page (citations in our corpus or others sharing the same primary CPC).