Epitaxial film forming method, sputtering apparatus, manufacturing method of semiconductor light-emitting element, semiconductor light-emitting element, and illumination device
US-2015102371-A1 · Apr 16, 2015 · US
US9252322B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9252322-B2 |
| Application number | US-201213661948-A |
| Country | US |
| Kind code | B2 |
| Filing date | Oct 26, 2012 |
| Priority date | Apr 30, 2010 |
| Publication date | Feb 2, 2016 |
| Grant date | Feb 2, 2016 |
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The present invention provides: an epitaxial film forming method capable of fabricating a +c-polarity epitaxial film made of a Group III nitride semiconductor by sputtering; and a vacuum processing apparatus suitable for this epitaxial film forming method. In one embodiment of the present invention, a Group III nitride semiconductor thin film is epitaxially grown by sputtering on an α-Al 2 O 3 substrate heated to a desired temperature by using a heater. First, the α-Al 2 O 3 substrate is disposed on a substrate holder including the heater in such a way that the α-Al 2 O 3 substrate is disposed away from the heater by a predetermined distance. Then, an epitaxial film of a Group III nitride semiconductor thin film is formed on the α-Al 2 O 3 substrate in the state where the α-Al 2 O 3 substrate is disposed away from the heater by the predetermined distance.
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The invention claimed is: 1. An epitaxial film forming method of epitaxially growing a Group III nitride semiconductor thin film by sputtering on an α-Al 2 O 3 substrate heated to a desired temperature by using a heater, the method comprising: holding the α-Al 2 O 3 substrate away from a substrate facing surface of the heater by 0.5-5 mm; and forming an epitaxial film of a Group III nitride semiconductor thin film by sputtering on the α-Al 2 O 3 substrate in a state of being held away from the substrate facing surface by 0.5-5 mm, the epitaxial film having +c polarity. 2. A semiconductor light emitting element manufacturing method comprising the epitaxial film forming method according to claim 1 . 3. A semiconductor light emitting element comprising an epitaxial film of a Group III nitride semiconductor thin film fabricated by the epitaxial film forming method according to claim 1 . 4. An illuminating device comprising the semiconductor light emitting element according to claim 3 . 5. An epitaxial film forming method of forming an epitaxial film of a Group III nitride semiconductor thin film by sputtering on an α-Al 2 O 3 substrate by using a vacuum processing apparatus including: a vacuum chamber capable of vacuum pumping; a substrate holder for supporting the α-Al 2 O 3 substrate; and a heater capable of heating the α-Al 2 O 3 substrate held by the substrate holder to a desired temperature, wherein an epitaxial film of a Group III nitride semiconductor thin film is formed by sputtering on the α-Al 2 O 3 substrate in a state where the α-Al 2 O 3 substrate held by the substrate holder is held away from a substrate facing surface of the heater by 0.5-5 mm, and wherein the epitaxial film has a +c polarity. 6. The epitaxial film forming method according to claim 5 , wherein the substrate holder holds the α-Al 2 O 3 substrate in a state where the substrate holder is in contact with a surface of the α-Al 2 O 3 substrate on a lower side in a direction of gravity. 7. A semiconductor light emitting element manufacturing method comprising the epitaxial film forming method according to claim 5 . 8. A semiconductor light emitting element comprising an epitaxial film of a Group III nitride semiconductor thin film fabricated by the epitaxial film forming method according to claim 5 . 9. An illuminating device comprising the semiconductor light emitting element according to claim 8 .
Nitrides · CPC title
Nitrides · CPC title
being crystalline insulating materials · CPC title
using physical deposition, e.g. vacuum deposition or sputtering · CPC title
within the light-emitting regions · CPC title
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