Universal industrial analog input interface

Patent metadata

Field	Value
Publication number	US-9250299-B1
Application number	US-87171810-A
Country	US
Kind code	B1
Filing date	Aug 30, 2010
Priority date	Aug 28, 2009
Publication date	Feb 2, 2016
Grant date	Feb 2, 2016

Abstract

A sensor system comprising a plurality of sensors configured to produce an output based on at least one condition and isolated from a measurement circuit is described. The isolation circuit may be configurable to output an analog signal within the measurement range of a measurement signal.

First claim

What is claimed is:

1. A sensor system comprising:
a plurality of sensors configured to generate a plurality of electrical signals in response to at least one condition;
a measurement subsystem configured to convert the electrical signals to digitized values,
wherein the plurality of sensors is ohmically isolated from the measurement subsystem, and
wherein at least one of the plurality of sensors is coupled to the measurement subsystem through an analog isolation circuit; and

a configuration circuit for adjusting the electrical signals of the plurality of sensors, wherein the configuration circuit comprises a resistor network, a multiplexor coupled between the resistor network and the analog optoisolator, and a microcontroller configured to send signals to the multiplexor to connect and disconnect resistors in the resistor network based on expected electrical signals from each of the plurality of sensors.

2. The sensor system of claim 1 further comprising a processing unit configured to receive the digitized values and to execute commands based on the received digitized values.

3. The sensor system of claim 1 , wherein the measurement circuit is implemented in a mixed-signal array.

4. The sensor system of claim 1 , wherein each sensor of the plurality of sensors is ohmically isolated from the measurement circuit and from the other sensors of the plurality of sensors, and configured to remain in an operational mode despite an operational status of any of the other sensors of the plurality of sensors.

5. A method comprising:
measuring at least one condition with a plurality of sensors;
generating an analog signal with each of the plurality of sensors based on the at least one condition;
communicating the analog signal from each of the plurality of sensors to a measurement circuit through an analog isolation circuit; and
adjusting the analog signal for at least one of the plurality of sensors with a microcontroller and through a plurality of switches, a resistor network, and a multiplexor coupled between the resistor network and the analog optoisolator to connect and disconnect resistors in the resistor network based on expected values from the respective sensor of the plurality of sensors.

6. The method of claim 5 wherein communicating the analog signal comprises isolating the plurality of sensors from the measurement circuit through a plurality of linear optocouplers.

7. The method of claim 5 further comprising:
adjusting a gain of the analog signal from the analog isolation circuit between the plurality of sensors and the measurement circuit;
digitizing the gain-adjusted signal; and
communicating the digitized, gain-adjusted signal to a host.

8. The method of claim 7 , wherein adjusting the gain of the analog signal from the isolation circuit comprises:
coupling at least one of a plurality of resistors to the isolation circuit through the plurality of switches.

9. The method of claim 8 , wherein the coupling of at least one of the plurality of resistors includes sending control signals to the plurality of switches, the signals controlling the selection of resistors of the plurality of resistors that are coupled to the isolation circuit.

10. The method of claim 5 , including maintaining the measuring, generating and communicating for all operational sensors of the plurality of sensors regardless of the operational status of the other sensors of the plurality of sensors.

11. An analog signal processing device comprising:
a measurement circuit configured to convert an analog output from at least one sensor of a plurality of sensors to a digital value;
a processor configured to execute commands for the processing and communication of the digital value; and
a configuration circuit for adjusting the electrical signals of the plurality of sensors, wherein the configuration circuit comprises a resistor network, a multiplexor coupled between the resistor network and the analog optoisolator, and a microcontroller configured to send signals to the multiplexor to connect and disconnect resistors in the resistor network based on expected electrical signals from each of the plurality of sensors
wherein the at least one sensor sensors is ohmically isolated from the measurement subsystem through an analog isolation circuit.

12. The analog signal processing device of claim 11 , further comprising an isolated replica of a closed-loop follower.

13. The analog signal processing device of claim 11 , wherein the configuration circuit comprises a resistor network.

14. The analog signal processing device of claim 13 , wherein the configuration circuit is configured to couple one, all or some combination of a plurality of resistors in the resistor network to the isolation circuit according to commands executed by the microcontroller.

15. The analog signal processing device of claim 11 , wherein the measurement circuit is implemented in a mixed-signal array.

16. The analog signal processing device of claim 11 wherein each sensor of the plurality of sensors is isolated from the measurement circuit and from the other sensors of the plurality of sensors and configured to remain in an operational mode despite an operational status of any of the other sensors of the plurality of sensors.

17. The analog signal processing device of claim 11 , wherein the measurement circuit is implemented on a plurality of integrated circuits.

Assignees

• Yarlagadda Archana
• Richardson Derek
• Kavaiya Gaurang
• Seguine Dennis
• Hastings Mark
• Cypress Semiconductor Corp

Inventors

• Yarlagadda Archana
• Richardson Derek
• Kavaiya Gaurang
• Seguine Dennis
• Hastings Mark

Classifications

• G01D21/02 Primary

  Measuring two or more variables by means not covered by a single other subclass · CPC title

• G01R19/0092

  Measuring current only · CPC title

• G01R33/0005 Primary

  Geometrical arrangement of magnetic sensor elements; Apparatus combining different magnetic sensor types (G01R33/0206 takes precedence) · CPC title

• G01R31/2829

  Testing of circuits in sensor or actuator systems (testing of apparatus for measuring electric or magnetic variables G01R35/00; testing of indicating or recording apparatus G01D; in airbag systems B60R21/0173; checking gas analysers G01N33/007; monitoring or fail-safe circuits for electromagnets H01F7/1844) · CPC title