Flexible TFT backpanel by glass substrate removal

Patent metadata

Field	Value
Publication number	US-9240437-B2
Application number	US-201414216920-A
Country	US
Kind code	B2
Filing date	Mar 17, 2014
Priority date	Mar 17, 2014
Publication date	Jan 19, 2016
Grant date	Jan 19, 2016

Abstract

A process of fabricating a flexible TFT back-panel on a glass support includes a step of providing a flat glass support member sufficiently thick to prevent bending during the processing. A layer of etch stop material is positioned on the upper surface of the glass support member and an insulating buffer layer is positioned on the layer of etch stop material. A TFT back-panel is positioned on the insulating buffer layer and a flexible plastic carrier is affixed to the TFT back-panel. The glass support member is etched away, whereby a flexible TFT back-panel is provided. The TFT back-panel can include a matrix of either OLED cells or LCD cells.

First claim

Having fully described the invention in such clear and concise terms as to enable those skilled in the art to understand and practice the same, the invention claimed is:

1. A process of fabricating a flexible TFT back-panel on a glass support comprising the steps of:
providing a flat glass support member having an upper surface;
positioning a layer of etch stop material on the upper surface of the glass support member;
positioning an insulating buffer layer on the layer of etch stop material;
positioning a TFT back-panel on the insulating buffer layer;
affixing a flexible plastic carrier to the TFT back-panel; and
etching the glass support member away, whereby a flexible TFT back-panel is provided.

2. A process as claimed in claim 1 wherein the step of positioning the layer of etch stop material includes positioning a layer with a thickness less than 200 nm.

3. A process as claimed in claim 1 wherein the step of positioning the layer of etch stop material includes positioning a layer with a thickness of 100 nm or less.

4. A process as claimed in claim 1 wherein the step of positioning the layer of etch stop material includes positioning one of a layer of noble metal, a layer of transition metal in the 5B or 6B column of the periodic table, and a layer of poly-silicon.

5. A process as claimed in claim 4 wherein the etch stop layer includes noble metal and further including a step of reclaiming the noble metal subsequent to the step of etching the glass support member away.

6. A process as claimed in claim 4 wherein the etch stop layer includes poly-silicon and the step of positioning the layer of poly-silicon includes the steps of depositing a layer of amorphous silicon (a-Si) on the upper surface of the flat glass support member and crystallizing the amorphous silicon (a-Si) into poly-Si at a temperature above 500° C. prior to the step of positioning the insulating buffer layer.

7. A process as claimed in claim 1 wherein the step of positioning the TFT back-panel includes positioning a matrix of one of OLED cells, LCD cells, photosensor elements, radiation sensor elements, or MEMS elements.

8. A process as claimed in claim 7 wherein the TFT back-panel includes a matrix of OLED cells and the step of positioning the insulating buffer layer includes forming a hermetic seal protecting the OLED cells.

9. A process as claimed in claim 1 wherein the step of positioning the TFT back-panel includes positioning a color filter, whereby the flexible TFT back-panel is a full color display.

10. A process as claimed in claim 1 wherein the step of positioning the insulating buffer layer includes forming a layer of material capable of withstanding temperatures up to 300 degrees Celsius.

11. A process as claimed in claim 10 wherein the step of positioning the insulating buffer layer includes forming the insulating buffer layer of one of polyimide, bisbenzocyclobutene (BCB), polytetrafluroethylene (PTFE), or bolaamphiphiles oligomers deposited by one of spin coating, spray coating, or screen printing.

12. A process as claimed in claim 10 wherein the step of positioning the insulating buffer layer includes forming the insulating buffer layer of one of hexamethuldisiloxane (HMDSO), SiO2 and SiN deposited by plasma enhanced chemical vapor deposition (PECVD).

13. A process of fabricating a flexible TFT back-panel on a glass support comprising the steps of:
providing a flat glass support member having an upper surface;
positioning a layer of etch stop material on the upper surface of the glass support member, the layer of etch stop material including one of a layer of noble metal and a layer of poly-silicon;
positioning an insulating buffer layer on the layer of etch stop material;
positioning a TFT back-panel on the insulating buffer layer, the TFT back-panel including one of a matrix of OLED cells or LCD cells, and a color filter, whereby a full color display is provided;
affixing a flexible plastic carrier to the TFT back-panel; and
etching the glass support member away, whereby a flexible TFT back-panel is provided.

14. A process as claimed in claim 13 wherein the etch stop layer includes noble metal and further including a step of reclaiming the noble metal subsequent to the step of etching the glass support member away.

15. A process as claimed in claim 13 wherein the etch stop layer includes poly-silicon and the step of positioning the layer of poly-silicon includes the steps of depositing a layer of amorphous silicon (a-Si) on the upper surface of the flat glass support member and crystallizing the amorphous silicon (a-Si) into poly-Si at a temperature above 500° C. prior to the step of positioning the insulating buffer layer.

16. A process as claimed in claim 13 wherein the TFT back-panel includes a matrix of OLED cells and the step of positioning the insulating buffer layer includes forming a hermetic seal protecting the OLED cells.

17. A process as claimed in claim 13 wherein the step of positioning the insulating buffer layer includes forming a layer of material capable of withstanding temperatures up to 300 degrees Celsius.

18. A process as claimed in claim 17 wherein the step of positioning the insulating buffer layer includes forming the insulating buffer layer of one of polyimide, bisbenzocyclobutene (BCB), polytetrafluroethylene (PTFE), or bolaamphiphiles oligomers deposited by one of spin coating, spray coating or screen printing.

19. A process as claimed in claim 17 wherein the step of positioning the insulating buffer layer includes forming the insulating buffer layer of one of hexamethuldisiloxane (HMDSO), SiO2 and SiN deposited by plasma enhanced chemical vapor deposition (PECVD).

20. A process of fabricating a flexible TFT back-panel on a glass support comprising the steps of:
providing a flat glass support member having an upper surface;
positioning a layer of etch stop material on the upper surface of the glass support member, the layer of etch stop material selected to stop HF etch and including one of a layer of noble metal and a layer of poly-silicon;
positioning an insulating buffer layer on the layer of etch stop material;
positioning a TFT back-panel on the insulating buffer layer, the TFT back-panel including one of a matrix of OLED cells or LCD cells, and a color filter, whereby a full color display is provided;
affixing a flexible plastic carrier to the TFT back-panel; and
using an HF etch removing the glass support member from the structure, whereby a flexible TFT back-panel is provided.

Assignees

• Shieh Chan-Long
• Foong Fatt
• Yu Gang
• Wang Guangming
• Cbrite Inc

Inventors

• Shieh Chan-Long
• Foong Fatt
• Yu Gang
• Wang Guangming

Classifications

• H10K59/8722

  Peripheral sealing arrangements, e.g. adhesives, sealants · CPC title

• H10K59/12

  Active-matrix OLED [AMOLED] displays · CPC title

• H10K71/80 Primary

  using temporary substrates · CPC title

• H10D86/021

  of multiple TFTs · CPC title

• H10D30/6758

  characterised by the insulating substrates · CPC title