Image sensor defect identification using blurring techniques

Patent metadata

Field	Value
Publication number	US-9232121-B2
Application number	US-201314036939-A
Country	US
Kind code	B2
Filing date	Sep 25, 2013
Priority date	Aug 31, 2006
Publication date	Jan 5, 2016
Grant date	Jan 5, 2016

Abstract

Embodiments described herein may operate to image a scene with an imaging system using an image blurring technique. An image sensor array (ISA) element may be identified as a dark defect element if a first ratio of an average of a set of illuminance signal magnitudes from a set of surrounding ISA elements to a magnitude of an illuminance signal from the ISA element is greater than a threshold sharpness value. The image sensor array element may be identified as a bright defect element if a second ratio of the magnitude of the illuminance signal from the ISA element to the average of the set of illuminance signal magnitudes from the set of surrounding ISA elements is greater than the threshold sharpness value.

First claim

What is claimed is:

1. A system comprising:
a calibration imaging system to capture a plurality of blurred calibration images of a calibration scene, wherein at least one known unusable calibration image sensor array (ISA) element is present at a known location in a calibration ISA associated with the calibration imaging system;
a calibration defect detector operatively coupled to the calibration ISA to identify a calibration ISA element as a candidate unusable element if a cali…

Assignees

• Micron Technology Inc

Inventors

• Ovsiannikov Ilia

Classifications

• H04N17/002 Primary

  Electricity · mapped topic

• H04N25/683

  Electricity · mapped topic

• H04N25/68

  Electricity · mapped topic

• H04N25/63

  Electricity · mapped topic

• H04N5/3675

  Electricity · mapped topic