Group III nitride semiconductor light emitting device

Patent metadata

Field	Value
Publication number	US-9231370-B2
Application number	US-201213453743-A
Country	US
Kind code	B2
Filing date	Apr 23, 2012
Priority date	Aug 26, 2011
Publication date	Jan 5, 2016
Grant date	Jan 5, 2016

Abstract

A group III nitride semiconductor laser device includes a laser structure, an insulating layer, an electrode and dielectric multilayers. The laser structure includes a semiconductor region on a semi-polar primary surface of a hexagonal group III nitride semiconductor support base. The dielectric multilayers are on first and second end-faces for the laser cavity. The c-axis of the group III nitride tilts by an angle ALPHA from the normal axis of the primary surface in the waveguide axis direction from the first end-face to the second end-faces. A pad electrode has first to third portions provided on the first to third regions of the semiconductor regions, respectively. An ohmic electrode is in contact with the third region through an opening of the insulating layer. The first portion has a first arm, which extends to the first end-face edge. The third portion is away from the first end-face edge.

First claim

What is claimed is:

1. A group III nitride semiconductor laser device comprising:
a laser structure including a support base and a semiconductor region, the support base having a semi-polar primary surface and comprising a hexagonal group III nitride semiconductor, the semiconductor region being provided on the semi-polar primary surface of the support base, the laser structure having first and second end faces for a laser cavity of the group III nitride semiconductor laser device;
an insulating layer provided on the semiconductor region of the laser structure;
an electrode provided on the semiconductor region of the laser structure and the insulating layer; and
a dielectric multilayer provided on each of the first end face and the second end face;
a c-axis of the hexagonal group III nitride semiconductor of the support base tilting from a normal axis of the semi-polar primary surface by an angle ALPHA in a direction of a waveguide axis, the waveguide axis extending from the first end face to the second end face,
the semiconductor region including a first region, a second region, and a third region, the first to third regions extending in the direction of the waveguide axis,
the third region being provided between the first region and the second region,
the third region of the semiconductor region including a first cladding layer, a second cladding layer and an active layer, the first cladding layer comprising a first conductivity type gallium nitride-based semiconductor, the second cladding layer comprising a second conductivity type of gallium nitride-based semiconductor, and the active layer provided between the first cladding layer and the second cladding layer,
the insulating layer having an opening on the third region of the semiconductor region,
the electrode including an ohmic electrode and a pad electrode,
the ohmic electrode being in contact with the third region of the semiconductor region through the opening of the insulating layer,
the pad electrode having a first electrode portion, a second electrode portion and a third electrode portion, the first electrode portion being provided on the first region, the second electrode portion being provided on the second region, and the third electrode portion being provided on the third region,
the first electrode portion having a first arm, and
the first arm extending to the first end face, and the third electrode portion being provided away from the first end face,
wherein the dielectric multilayer is provided on an end face of the first arm,
wherein the end face of the first arm is contiguous with the first end face of the laser structure.

2. The group III nitride semiconductor laser device according to claim 1 , wherein the angle ALPHA is within a range of 45 to 80 degrees or 100 to 135 degrees.

3. The group III nitride semiconductor laser device according to claim 1 , wherein
the laser structure has a first surface and a second surface, the first surface opposing the second surface, and
the first end face and the second end face extend from an edge of the first face to an edge of the second face.

4. The group III nitride semiconductor laser device according to claim 1 , wherein the angle ALPHA is within a range of 63 to 80 degrees or 100 to 117 degrees.

5. The group III nitride semiconductor laser device according to claim 1 , wherein the support base has a thickness of not more than 400 μm.

6. The group III nitride semiconductor laser device according to claim 1 , wherein the support base has a thickness of 50 to 100 μm.

7. The group III nitride semiconductor laser device according to claim 1 , wherein
the first cladding layer, the second cladding layer, and the active layer are arranged in a direction of the normal axis, and
the third region of the semiconductor region has a ridge extending in the direction of the waveguide axis.

8. The group III nitride semiconductor laser device according to claim 1 , wherein the semi-polar primary surface is inclined from one of a (20-21) plane, a (10-11) plane, a (20-2-1) plane, and a (10-1-1) plane by an angle in a range of −4 to +4 degrees.

9. The group III nitride semiconductor laser device according to claim 1 , wherein the semi-polar primary surface comprises one of a (20-21) plane, a (10-11) plane, a (20-2-1) plane, and a (10-1-1) plane.

10. The group III nitride semiconductor laser device according to claim 1 , wherein the support base comprises one of GaN, AlGaN, AlN, InGaN, and InAlGaN.

11. The group III nitride semiconductor laser device according to claim 1 , wherein
the active layer includes a gallium nitride-based semiconductor layer, and
the active layer includes a light-emitting region emitting light having a wavelength of not less than 500 nm.

12. The group III nitride semiconductor laser device according to claim 1 , wherein the c-axis of the hexagonal group III nitride semiconductor of the support base tilts toward an m-axis of the hexagonal group III nitride semiconductor.

13. The group III nitride semiconductor laser device according to claim 1 , wherein
an end face of the support base and an end face of the semiconductor region are exposed at each of the first and second end faces, and
an angle between an end face of the active layer of the semiconductor region and a reference plane orthogonal to an m-axis of the support base comprising the hexagonal group III nitride semiconductor is in a range of (ALPHA-5) to (ALPHA+5) on a first plane defined by the c-axis and the m-axis of the hexagonal group III nitride semiconductor.

14. The group III nitride semiconductor laser device according to claim 13 , wherein the angle is in a range of −5 to +5 degrees on a second plane orthogonal to the first plane and the normal axis.

15. The group III nitride semiconductor laser device according to claim 1 , wherein
the second electrode portion has a second arm, and
the second arm extends to an edge of the first end face.

16. The group III nitride semiconductor laser device according to claim 1 , wherein the ohmic electrode comprises palladium.

17. The group III nitride semiconductor laser device according to claim 1 , wherein the first end face differs from a cleaved face.

18. The group III nitride semiconductor laser device according to claim 1 , wherein the end face of the first arm forms a flat surface with the first end face of the laser structure.

19. The group III nitride semiconductor laser device according to claim 1 , the first arm having a top surface, wherein the dielectric multilayer is not provided on the top surface of the first arm.

20. The group III nitride semiconductor laser device according to claim 1 , wherein the dielectric multilayer forms a planar surface on the end face of the first arm and the first end face of the laser structure.

Assignees

• Sumitomo Takamichi
• Kyono Takashi
• Ueno Masaki
• Yoshizumi Yusuke
• Enya Yohei
• Adachi Masahiro
• Takagi Shimpei
• Yanashima Katsunori
• Sumitomo Electric Industries
• Sony Corp

Inventors

• Sumitomo Takamichi
• Kyono Takashi
• Ueno Masaki
• Yoshizumi Yusuke
• Enya Yohei
• Adachi Masahiro
• Takagi Shimpei
• Yanashima Katsunori

Classifications

• H01S5/04254

  characterised by the shape · CPC title

• H01S5/320275

  semi-polar orientation · CPC title

• H01S5/028

  Coatings {; Treatment of the laser facets, e.g. etching, passivation layers or reflecting layers} · CPC title

• B82Y20/00 Primary

  Nanooptics, e.g. quantum optics or photonic crystals · CPC title

• H01S5/34333 Primary

  with a well layer based on Ga(In)N or Ga(In)P, e.g. blue laser · CPC title