Program verify word line ramping delay for lower current consumption mode
US-2024395343-A1 · Nov 28, 2024 · US
US9224488B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9224488-B2 |
| Application number | US-201313830263-A |
| Country | US |
| Kind code | B2 |
| Filing date | Mar 14, 2013 |
| Priority date | Sep 13, 2012 |
| Publication date | Dec 29, 2015 |
| Grant date | Dec 29, 2015 |
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Official abstract text for this publication.
According to one embodiment, a semiconductor memory device includes the following structure. A memory cell array includes memory cells arranged at positions where bit lines and word lines cross are arranged on a semiconductor substrate. A sense amplifier reads data stored in the memory cell. The hookup region includes a transfer transistor arranged between the memory cell array and the sense amplifier. One end of a current path of the transfer transistor is connected to a first interconnect formed between the semiconductor substrate and the bit line. The other end of the current path is connected to the sense amplifier. A guard ring region is arranged between the memory cell array and the hookup region. A contact plug is arranged to overlap the guard ring region.
Opening claim text (preview).
What is claimed is: 1. A semiconductor memory device comprising: a memory cell array in which memory cells arranged at positions where bit lines and word lines cross each other are arranged on a semiconductor substrate; a sense amplifier configured to read data stored in one of the memory cells via the bit line in a read operation; a hookup region comprising a transfer transistor arranged between the memory cell array and the sense amplifier, one end of a current path of the t…
Physics · mapped topic
Physics · mapped topic
Physics · mapped topic
Physics · mapped topic
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