Automated inspection system
US-2024420305-A1 · Dec 19, 2024 · US
US9218655B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9218655-B2 |
| Application number | US-201314047068-A |
| Country | US |
| Kind code | B2 |
| Filing date | Oct 7, 2013 |
| Priority date | Jan 16, 2013 |
| Publication date | Dec 22, 2015 |
| Grant date | Dec 22, 2015 |
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Official abstract text for this publication.
A brightness measuring method of device with backlight is performed by a controlling device, for measuring legends of backlight provided by a backlight module of a device under test (DUT). The method includes turning on a uniform light source external to the DUT for illuminating the DUT; capturing and receiving an image of the DUT illuminated with uniform light as a base image; identifying a complete pattern of a to-be-measured legend in the base image; turning off the uniform light source and turning on the backlight of the DUT so as to illuminate the legend of DUT; capturing and receiving an image of the DUT illuminated with backlight as a comparison image, wherein the scope of the comparison image overlaps the scope of the base image; and calculating brightness values of a plurality of pixels in the comparison image whose positions overlap the positions of the complete pattern.
Opening claim text (preview).
What is claimed is: 1. A brightness measuring method of device with backlight, performed by a controlling device to measure a legend of backlight provided by a backlight module of a device under test (DUT), the method comprising: turning on a uniform light source external to the DUT so as to illuminate the DUT; indicating to capture an image of the DUT illuminated with the uniform light source as a base image; receiving the base image; identifying a complete pattern of a to-…
Physics · mapped topic
Physics · mapped topic
Physics · mapped topic
Physics · mapped topic
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