Error response circuit, semiconductor integrated circuit, and data transfer control method

Patent metadata

Field	Value
Publication number	US-9213617-B2
Application number	US-201313785123-A
Country	US
Kind code	B2
Filing date	Mar 5, 2013
Priority date	Mar 27, 2012
Publication date	Dec 15, 2015
Grant date	Dec 15, 2015

Abstract

In an error response circuit an analysis circuit unit analyzes a command transmitted from a first circuit section to a second circuit section, and detects a status of data transfer between the first circuit section and the second circuit section. A response circuit unit generates an error signal in accordance with the detected status of the data transfer in response to the second circuit section changing from a first power consumption state to a second power consumption state in which power consumption is lower than power consumption in the first power consumption state. A switching circuit unit transmits the error signal to the first circuit section in place of a response signal that is responsive to the command and transmitted from the second circuit section to the first circuit section.

First claim

What is claimed is:

1. An error response circuit comprising:
an analysis circuit unit configured to analyze a command transmitted from a first circuit section to a second circuit section and to detect a status which indicated whether data transfer between the first circuit section and the second circuit section is being performed or not;
a response circuit unit configured to generate an error signal in response to the second circuit section changing from a first power consumptio…

Assignees

• Fujitsu Semiconductor Ltd
• Socionext Inc

Inventors

• Saito Natsumi
• Nimoda Eiichi

Classifications

• G06F11/0751

  Physics · mapped topic

• G06F11/3055

  Physics · mapped topic

• G06F11/3041

  Physics · mapped topic

• G06F1/28

  Physics · mapped topic

• G06F11/0766

  Physics · mapped topic