Power delivery system with mitigation for radiation induced single event latch-up in microelectronic devices
US-2015370274-A1 · Dec 24, 2015 · US
US9201439B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9201439-B2 |
| Application number | US-201313751326-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jan 28, 2013 |
| Priority date | Mar 13, 2012 |
| Publication date | Dec 1, 2015 |
| Grant date | Dec 1, 2015 |
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A semiconductor device includes a voltage hold circuit that raises a second boosted voltage with rise of an output voltage of a booster circuit that generates a first boosted voltage and then maintains the second boosted voltage at a point when the output voltage reaches a hold voltage level after that, and a first switch that short-circuits a first output terminal through which the first boosted voltage is output and a second output terminal through which the second boosted voltage is output until the output voltage reaches the hold voltage level.
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What is claimed is: 1. A semiconductor device comprising: a booster circuit that boosts an input voltage and generates a first boosted voltage; a voltage hold circuit that holds a second boosted voltage having a smaller absolute value than the first boosted voltage; a first output terminal through which the first boosted voltage is output; a second output terminal through which the second boosted voltage is output; a first switch that is placed between the first output ter…
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