Method to etch non-volatile metal materials
US-2015340603-A1 · Nov 26, 2015 · US
US9196826B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9196826-B2 |
| Application number | US-201414536322-A |
| Country | US |
| Kind code | B2 |
| Filing date | Nov 7, 2014 |
| Priority date | Mar 24, 2011 |
| Publication date | Nov 24, 2015 |
| Grant date | Nov 24, 2015 |
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A method for manufacturing a semiconductor memory device includes forming a magnetic tunnel junction layer on a lower electrode, forming a spacer having an annular shape on the magnetic tunnel junction layer, forming upper electrodes on both sidewall surfaces of the annular shaped spacer, removing the spacer, and etching the magnetic tunnel junction layer by using the upper electrodes as an etch mask.
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What is claimed is: 1. A method for manufacturing a semiconductor memory device, comprising: forming a magnetic tunnel junction layer on a lower electrode; forming a spacer having an annular shape on the magnetic tunnel junction layer; forming upper electrodes on both sidewall surfaces of the annular shaped spacer; removing the spacer; and etching the magnetic tunnel junction layer by using the upper electrodes as an etch mask. 2. The method as recite…
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