Non-contact conductivity measurement

US9176175B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9176175-B2
Application numberUS-201313969336-A
CountryUS
Kind codeB2
Filing dateAug 16, 2013
Priority dateMar 14, 2013
Publication dateNov 3, 2015
Grant dateNov 3, 2015

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  1. Title

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  2. Abstract

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  5. First independent claim

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Abstract

Official abstract text for this publication.

A method for analyzing a material-under-test includes levitating a free-floating magnet between a material-under-test and a diamagnet and a mounted magnet, such that the diamagnet is positioned between the mounted magnet and the free-floating magnet, measuring a rotation rate of the free-floating magnet over time, and calculating at least one of a conductivity and resistivity of the material-under-test based on the measured rotation rate of the free-floating magnet over time.

First claim

Opening claim text (preview).

What is claimed is: 1. A method for analyzing a material-under-test, comprising: levitating a free-floating magnet between a material-under-test, a diamagnet mounted to a support structure, and a mounted magnet, such that the diamagnet is positioned between the mounted magnet and the free-floating magnet; rotating the free-floating magnet in a physically separated manner with respect to the material-under-test; measuring a rotation rate of the free-floating magnet over time with a rotation detection assembly based on measuring a reflection of a laser beam projected toward the free-floating magnet, the rotation rate increasing or decreasing based on a drag torque effect of the material-under-test on the free-floating magnet; and calculating, via a conductivity calculation unit in electrical communication with the rotation detection assembly, at least one of a conductivity and resistivity of the material-under-test based on the measured rotation rate of the free-floating magnet over time. 2. The method of claim 1 , further comprising: rotating the material-under-test to generate a rotating drag for torque that induces the rotation of the floating magnet; and calculating the at least one of the conductivity and the resistivity of the material-under-test by measuring the increase in the rotation rate of the free-floating magnet over time. 3. The method of claim 1 , further comprising: initiating rotation of the free-floating magnet with respect to the material-under-test; maintaining stationary the material-under-test to apply a stationary drag torque upon the free-floating magnet, the stationary drag torque inhibiting the rotation of the free-floating magnet; and calculating the at least one of the conductivity and the resistivity of the material-under-test by measuring the decrease in the rotation rate of the free-floating magnet over time. 4. The method of claim 3 , wherein initiating the rotation of the free-floating magnet includes applying a force to the free-floating magnet with a solenoid disposed adjacent to the free-floating magnet, the solenoid including a coil and an armature. 5. The method of claim 3 , wherein initiating the rotation of the free-floating magnet includes applying a force to the free-floating magnet with a magnetic field generated by a stator coil that is disposed adjacent to the free-floating magnet.

Assignees

Inventors

Classifications

  • G01N27/72Primary

    by investigating magnetic variables · CPC title

  • by investigating resistance · CPC title

  • G01R27/32Primary

    in circuits having distributed constants {, e.g. having very long conductors or involving high frequencies} · CPC title

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What does patent US9176175B2 cover?
A method for analyzing a material-under-test includes levitating a free-floating magnet between a material-under-test and a diamagnet and a mounted magnet, such that the diamagnet is positioned between the mounted magnet and the free-floating magnet, measuring a rotation rate of the free-floating magnet over time, and calculating at least one of a conductivity and resistivity of the material-un…
Who is the assignee on this patent?
IBM
What technology area does this patent fall under?
Primary CPC classification G01N27/72. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Nov 03 2015 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).