System and moving modulated target with unmodulated position references for characterization of imaging sensors

Patent metadata

Field	Value
Publication number	US-9167239-B2
Application number	US-201314025727-A
Country	US
Kind code	B2
Filing date	Sep 12, 2013
Priority date	Sep 12, 2013
Publication date	Oct 20, 2015
Grant date	Oct 20, 2015

Abstract

Embodiments of a system for characterization of an imaging sensor using a moving modulated target with unmodulated position references is generally described herein. A target pattern comprises through-holes in a slide and resolved patches on the slide. The slide and patch have different emission intensities in the sensor' detection band. A modulation is applied to only the emission intensities of the through-holes. The target pattern is moved across the field-of view (FOV) of the imaging sensor to present the target pattern across different frames at different positions. Frames of images of the moving target pattern as seen in the FOV of the imaging sensor are captured to generate modulated image data outputs. The unmodulated position references provided by the resolved patches are measured and used to align the modulated image data outputs, which are processed to generate data products representative of a response of the imaging sensor.

First claim

What is claimed is:

1. A system for characterization of a pixelated imaging sensor, the system comprising:
a target comprising a slide formed of a first material, said target having a known target pattern comprising at least one through-hole in the slide and at least one resolved patch of a second material, said at least one through-hole and said at least one resolved patch having fixed relative positions, said first and second materials having different emission intensities in a…

Assignees

• Raytheon Co

Inventors

• Williams Darin S

Classifications

• H04N17/002 Primary

  Electricity · mapped topic