Selective etching process for SiGe and doped epitaxial silicon
US-12062571-B2 · Aug 13, 2024 · US
US9159641B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9159641-B2 |
| Application number | US-201414211247-A |
| Country | US |
| Kind code | B2 |
| Filing date | Mar 14, 2014 |
| Priority date | Mar 15, 2013 |
| Publication date | Oct 13, 2015 |
| Grant date | Oct 13, 2015 |
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An array of through-silicon vias (TSVs) are formed in a silicone substrate. The vias can be tapered such that the diameter of the via at the surface of the substrate is larger than the diameter of the via at its bottom, with the diameter varying continuously along its depth. After the via is formed, it is seeded with a thin layer of nanocrystalline diamond (NCD) particles, and a NCD film is grown on the bottom and along the sidewalls of the via. The presence of the diamond-filled vias provides improved thermal management to semiconductor devices formed on the silicon substrate.
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What is claimed is: 1. A process for making a nanocrystalline diamond-impregnated silicon substrate, comprising: etching a plurality of tapered through-silicon vias in a sample of silicon; seeding at least some of the through-silicon vias with nanodiamond particles; and growing a nanocrystalline diamond (NCD) coating from the seed nanodiamond particles to form a plurality of NCD-coated through-silicon vias having a predetermined pattern in the substrate.…
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
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