Visual model for image analysis of material characterization and analysis method thereof
US-11908118-B2 · Feb 20, 2024 · US
Alignment of an ordered stack of images from a specimen
US9159130B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9159130-B2 |
| Application number | US-201013502530-A |
| Country | US |
| Kind code | B2 |
| Filing date | Oct 14, 2010 |
| Priority date | Oct 22, 2009 |
| Publication date | Oct 13, 2015 |
| Grant date | Oct 13, 2015 |
How to read this patent
A practical reading order for non-experts. Skip the full description unless you need deep technical detail.
- Title
What the patent document calls the invention.
- Abstract
A short plain-language summary of the technical disclosure.
- Assignees and inventors
Who owns or filed the patent and who is credited as inventor.
- Key dates
Filing, priority, publication, and grant dates set the timeline.
- First independent claim
The legal scope of protection — read this for what is actually claimed.
- CPC / IPC classifications
Technology tags used to group this patent with similar filings.
- Citations and related patents
Prior art links and similar publications in this corpus.
Abstract
Official abstract text for this publication.
The present invention relates to the field of alignment of an ordered stack of images from a sliced specimen. According to the present method and apparatus, the ordered stack of images is aligned by successively determining, for at least two already aligned images of the ordered stack, the respective misalignments with an unaligned image which is to be aligned next, selecting from the at least two aligned images as a reference image that aligned image with which the unaligned image has the smallest amount of misalignment, and aligning the unaligned image with the selected reference image. This is intended to provide a robust and computationally cheap aligning method and apparatus.
First claim
Opening claim text (preview).
The invention claimed is: 1. A method for aligning an ordered stack of images from a specimen, comprising the successive steps of: determining, for at least two already aligned images of the ordered stack, the respective misalignments with an unaligned image which is to be aligned next in the ordered stack; discarding the unaligned image to be aligned next from the ordered stack of images if all of the determined misalignments amounts are above a certain threshold; replacing t…
Assignees
Inventors
Classifications
- G06V20/695Primary
Physics · mapped topic
Physics · mapped topic
Physics · mapped topic
- G06T7/0024Primary
Physics · mapped topic
Physics · mapped topic
Patent family
Related publications grouped by family.
External sources
Next steps
Free tools are coming soon. Tell us what you want to track and we'll notify you.
Frequently asked questions
Answers are generated from the same data shown on this page.
- What does patent US9159130B2 cover?
- The present invention relates to the field of alignment of an ordered stack of images from a sliced specimen. According to the present method and apparatus, the ordered stack of images is aligned by successively determining, for at least two already aligned images of the ordered stack, the respective misalignments with an unaligned image which is to be aligned next, selecting from the at least …
- Who is the assignee on this patent?
- Kneepkens Rik E J, Koninkl Philips Nv
- What technology area does this patent fall under?
- Primary CPC classification G06V20/695. Mapped technology areas include Physics.
- When was this patent published?
- Publication date Tue Oct 13 2015 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
- What related patents are in patentsdb?
- We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).