Semiconductor device and fault diagnosis system

Patent metadata

Field	Value
Publication number	US-9157948-B2
Application number	US-201313912474-A
Country	US
Kind code	B2
Filing date	Jun 7, 2013
Priority date	Jul 5, 2012
Publication date	Oct 13, 2015
Grant date	Oct 13, 2015

Abstract

Provided is a semiconductor device capable of performing fault detection on a circuit executing an AD conversion operation during the AD conversion operation. The semiconductor device includes an analog to digital conversion unit that converts a second analog signal into a first digital signal, in which the second analog signal is obtained by adding a first analog signal and an offset signal with a signal band different from the first analog signal, a signal extraction unit that extracts from the first digital signal a second digital signal corresponding to the signal band of the offset signal, and a fault detection unit that detects a fault in the analog to digital conversion unit based on the second digital signal and a setting value that is set upon generating the offset signal.

First claim

What is claimed is:

1. A semiconductor device comprising:
an analog to digital conversion unit that converts a second analog signal into a first digital signal, the second analog signal being obtained by adding a first analog signal and an offset signal with a signal band different from the first analog signal;
a signal extraction unit that extracts a second digital signal from the first digital signal, the second digital signal corresponding to the signal band of the offset sig…

Assignees

• Renesas Electronics Corp

Inventors

• Tsuda Kazutoshi

Classifications

• G01R31/26 Primary

  Physics · mapped topic

• H03M1/12

  Electricity · mapped topic

• H03M3/458

  Electricity · mapped topic

• H03M1/1076 Primary

  Electricity · mapped topic

• H03M3/378

  Electricity · mapped topic