Package substrate and semiconductor package including the same
US-2024429153-A1 · Dec 26, 2024 · US
US9153530B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9153530-B2 |
| Application number | US-201113162064-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jun 16, 2011 |
| Priority date | Jun 16, 2011 |
| Publication date | Oct 6, 2015 |
| Grant date | Oct 6, 2015 |
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Official abstract text for this publication.
Systems and methods according to embodiments of the invention enable flip chip packaging using high density routing while minimizing the thickness and layer count of the flip chip package. By using a photoresist layer to create very fine traces on a metallic base layer, embodiments of the present invention combine advantages of leadframe substrates and laminate substrates by supporting high-density routing while minimizing layer count and manufacturing cost. Additionally, the use of raised metallic pads in a routing layer enables embodiments of the present invention to include highly compact traces that pass over IC die bond pad connection sites without directly coupling to these bond IC die bond pad connection sites. Further, embodiments of the present invention can support multiple thin routing layers without the need for organic (e.g., laminate) material separating these routing layers.
Opening claim text (preview).
What is claimed is: 1. An integrated circuit (IC) device comprising: an IC die; a routing layer coupled to a surface of the IC die, wherein the routing layer includes: a plurality of metallic traces including a first metallic trace, and a molding portion surrounding the plurality of metallic traces, wherein a thickness of the first metallic trace is substantially equal to a thickness of the molding portion, wherein a side portion of the molding portion is coupled to a side po…
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
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