Semiconductor device and method of manufacturing same
US-2024395697-A1 · Nov 28, 2024 · US
US9147604B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9147604-B2 |
| Application number | US-201414582899-A |
| Country | US |
| Kind code | B2 |
| Filing date | Dec 24, 2014 |
| Priority date | Aug 21, 2012 |
| Publication date | Sep 29, 2015 |
| Grant date | Sep 29, 2015 |
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Official abstract text for this publication.
A memory process is described. A substrate is provided, having therein trenches and conductive lines buried in the trenches and having thereon an array area, wherein each of the conductive lines has an array portion in the array area. A contact area apart from the array area is defined on the substrate, wherein each of the conductive lines has a contact portion in the contact area. The substrate between the contact portions of the conductive lines is etched down to below the tops of the conductive layers to form gaps between the contact portions of the conductive lines. The gaps are then filled with an insulating layer.
Opening claim text (preview).
What is claimed is: 1. A memory process, comprising: providing a substrate, wherein the substrate has therein a plurality of trenches and a plurality of conductive lines buried in the trenches and has thereon an array area, and each of the conductive lines has an array portion in the array area; defining a contact area apart from the array area on the substrate, wherein each of the conductive lines has a contact portion in the contact area; etching the substrate between the co…
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
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