Program verify word line ramping delay for lower current consumption mode
US-2024395343-A1 · Nov 28, 2024 · US
US9147484B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9147484-B2 |
| Application number | US-201414200454-A |
| Country | US |
| Kind code | B2 |
| Filing date | Mar 7, 2014 |
| Priority date | Sep 26, 2013 |
| Publication date | Sep 29, 2015 |
| Grant date | Sep 29, 2015 |
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A semiconductor memory device and an operating method thereof are provided. The semiconductor memory device includes a memory cell array including a plurality of memory groups each including at least a drain-select transistor and a plurality of memory cells, a voltage generator suitable for generating a read voltage that is to be applied to a selected memory cell of the memory cells and a pass voltage that is to be applied to unselected memory cells other than the selected memory cell among the memory cells, and a control logic suitable for controlling the voltage generator to generate the pass voltage to have different levels depending on a distance between the drain-select transistor and the selected memory cell during a read operation.
Opening claim text (preview).
What is claimed is: 1. A semiconductor memory device comprising: a memory cell array including a plurality of memory groups each including at least a drain-select transistor and a plurality of memory cells; a voltage generator suitable for generating a read voltage that is to be applied to a selected memory cell of the memory cells and a pass voltage that is to be applied to unselected memory cells other than the selected memory cell among the memory cells; and a control logic…
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Physics · mapped topic
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