Program verify word line ramping delay for lower current consumption mode
US-2024395343-A1 · Nov 28, 2024 · US
US9147481B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9147481-B2 |
| Application number | US-201313842876-A |
| Country | US |
| Kind code | B2 |
| Filing date | Mar 15, 2013 |
| Priority date | Apr 27, 2012 |
| Publication date | Sep 29, 2015 |
| Grant date | Sep 29, 2015 |
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According to one embodiment, a semiconductor memory apparatus includes an array, a source, a bit line, a sense, and current circuit. The array includes a NAND string. The NAND string includes memory cell. The sense includes a first transistor. One end of transistor is connected to a first node, and other end of the transistor is connected to a second. The first node is used for reading the data held by the memory cell. An internal voltage is smaller than the source voltage. The current circuit outputs a first voltage to a gate of the transistor, and the first voltage is smaller than the internal voltage. The transistor limits a first current from the source to the sense based on a threshold voltage of the memory cell to be read.
Opening claim text (preview).
What is claimed is: 1. A semiconductor memory apparatus comprising: a memory cell array including a NAND string, the NAND string including a memory cell; a source connected to the NAND string, a source voltage being supplied to the source; a bit line connected to the NAND string; a sense amplifier including a first transistor, one end of a current path of the first transistor being connected to a first node, another end of the current path of the first transistor being conne…
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