Sensor tag and manufacturing method for sensor tag
US-2015349400-A1 · Dec 3, 2015 · US
Systems and methods for monitoring sensors
US9147144B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9147144-B2 |
| Application number | US-201213630954-A |
| Country | US |
| Kind code | B2 |
| Filing date | Sep 28, 2012 |
| Priority date | Sep 28, 2012 |
| Publication date | Sep 29, 2015 |
| Grant date | Sep 29, 2015 |
How to read this patent
A practical reading order for non-experts. Skip the full description unless you need deep technical detail.
- Title
What the patent document calls the invention.
- Abstract
A short plain-language summary of the technical disclosure.
- Assignees and inventors
Who owns or filed the patent and who is credited as inventor.
- Key dates
Filing, priority, publication, and grant dates set the timeline.
- First independent claim
The legal scope of protection — read this for what is actually claimed.
- CPC / IPC classifications
Technology tags used to group this patent with similar filings.
- Citations and related patents
Prior art links and similar publications in this corpus.
Abstract
Official abstract text for this publication.
A method for multivariable measurements using a single-chip impedance analyzer includes providing a sensor, exposing the sensor to an environmental parameter, determining a complex impedance of the sensor over a measured spectral frequency range of the sensor, and monitoring at least three spectral parameters of the sensor.
First claim
Opening claim text (preview).
The invention claimed is: 1. A method for re-calibration of individual multivariable sensor nodes in a sensor network, the method comprising: identifying one or more environmental parameters of interest that are monitored by the multivariable sensor nodes; identifying one or more interference parameters of interest that produce an interference response by the multivariable sensor nodes; measuring responses from the multivariable sensor nodes in response to exposure to one or m…
Assignees
Inventors
Classifications
- G06K19/0717Primary
Physics · mapped topic
Physics · mapped topic
Physics · mapped topic
Patent family
Related publications grouped by family.
External sources
Next steps
Free tools are coming soon. Tell us what you want to track and we'll notify you.
Frequently asked questions
Answers are generated from the same data shown on this page.
- What does patent US9147144B2 cover?
- A method for multivariable measurements using a single-chip impedance analyzer includes providing a sensor, exposing the sensor to an environmental parameter, determining a complex impedance of the sensor over a measured spectral frequency range of the sensor, and monitoring at least three spectral parameters of the sensor.
- Who is the assignee on this patent?
- Gen Electric
- What technology area does this patent fall under?
- Primary CPC classification G06K19/0717. Mapped technology areas include Physics.
- When was this patent published?
- Publication date Tue Sep 29 2015 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
- What related patents are in patentsdb?
- We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).