Integrated circuit with electrostatic discharge protection
US-2024395801-A1 · Nov 28, 2024 · US
US9136262B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9136262-B2 |
| Application number | US-201514613643-A |
| Country | US |
| Kind code | B2 |
| Filing date | Feb 4, 2015 |
| Priority date | Dec 13, 2011 |
| Publication date | Sep 15, 2015 |
| Grant date | Sep 15, 2015 |
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A semiconductor device includes a transistor having a gate electrode, a first electrode, and a second electrode and first and second protection circuits each having one end commonly connected to the gate electrode and the other end connected to the first and second electrodes, respectively. The first and second protection circuits are formed in first and second polysilicon layers, respectively, formed separately on a single field insulating film.
Opening claim text (preview).
What is claimed is: 1. A semiconductor device, comprising: a MOSFET having a gate, a drain and a source; a gate pad coupled with the gate; a source pad coupled with the source; a drain electrode coupled with the drain; a first protection circuit coupled with the drain and the gate, the first protection circuit including a first pair of diodes whose anodes are coupled each other; and a second protection circuit coupled with the source and the gate, the second protection c…
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
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