Transistor device and fabrication method

US9136183B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-9136183-B2
Application numberUS-201314143623-A
CountryUS
Kind codeB2
Filing dateDec 30, 2013
Priority dateJan 8, 2013
Publication dateSep 15, 2015
Grant dateSep 15, 2015

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  2. Abstract

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  5. First independent claim

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Abstract

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Fabrication methods for junctionless transistor and complementary junctionless transistor. An isolation layer doped with a first-type ion is formed on a semiconductor substrate and an active layer doped with a second-type ion is formed on the isolation layer. The active layer includes a first portion between a second portion and a third portion of the active layer. Portions of the isolation layer under the second and third portions of the active layer are removed to suspend the second and third portions of the active layer. A gate structure is formed on the first portion of the active layer. A source and a drain are formed by doping the second portion and the third portion of the active layer with the second-type ion on both sides of the gate structure. The source and the drain have a same doping type as the first portion of the active layer.

First claim

Opening claim text (preview).

What is claimed is: 1. A method for forming a complementary junctionless transistor device comprising: providing a semiconductor substrate, wherein the semiconductor substrate includes an N-field-effect transistor (NFET) portion and a P-field-effect transistor (PFET) portion neighboring with each other; forming an isolation layer on the semiconductor substrate and an active layer on the isolation layer, wherein the active layer and the isolation layer are made of materials havin…

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What does patent US9136183B2 cover?
Fabrication methods for junctionless transistor and complementary junctionless transistor. An isolation layer doped with a first-type ion is formed on a semiconductor substrate and an active layer doped with a second-type ion is formed on the isolation layer. The active layer includes a first portion between a second portion and a third portion of the active layer. Portions of the isolation lay…
Who is the assignee on this patent?
Semiconductor Mfg Int Shanghai
What technology area does this patent fall under?
Primary CPC classification H10D84/0188. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Sep 15 2015 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).