Two-tier defect scan management
US-2024402922-A1 · Dec 5, 2024 · US
US9136018B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9136018-B2 |
| Application number | US-201313846691-A |
| Country | US |
| Kind code | B2 |
| Filing date | Mar 18, 2013 |
| Priority date | Nov 28, 2012 |
| Publication date | Sep 15, 2015 |
| Grant date | Sep 15, 2015 |
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An internal voltage generation circuit includes a reference voltage generator and an internal voltage generator. The reference voltage generator is configured to adjust resistance values according to test signals and to generate an upper limit reference voltage and a lower limit reference voltage whose levels are determined according to the resistance values. The internal voltage generator is configured to generate an internal voltage which is driven according to the levels of the upper and lower limit reference voltages.
Opening claim text (preview).
What is claimed is: 1. An internal voltage generation circuit, the circuit comprising: a test signal generator configured to generate voltage control test signals for adjusting resistance values used in division of a power supply voltage and to generate dead zone control test signals for setting a dead zone window that an internal voltage is not driven; a voltage divider configured to divide the power supply voltage using the resistance values which are set by the voltage contro…
Physics · mapped topic
Physics · mapped topic
Physics · mapped topic
Physics · mapped topic
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