Thin film transistor array panel
US-9455333-B2 · Sep 27, 2016 · US
US9129809B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9129809-B2 |
| Application number | US-201313958901-A |
| Country | US |
| Kind code | B2 |
| Filing date | Aug 5, 2013 |
| Priority date | Aug 5, 2013 |
| Publication date | Sep 8, 2015 |
| Grant date | Sep 8, 2015 |
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In a silicon-controlled rectifier, an anode region includes p-type anode well regions which are laterally surrounded by an n-type well region. A length of a p-type anode well region, as measured in a first direction, is greater than a width of the p-type anode well region, as measured in a second direction perpendicular to the first direction. A p-type well region meets the n-type well region at a junction, wherein the junction extends between the p-type well region and n-type well region in the second direction. A cathode region includes a plurality of n-type cathode well regions which are formed in the p-type well region. A length of an n-type cathode well region, as measured in the first direction, is greater than a width of the n-type cathode well region, as measured in the second direction.
Opening claim text (preview).
What is claimed is: 1. A silicon-controlled rectifier (SCR), comprising: an anode region comprising a plurality of linear or t-shaped p-type anode wells extending in parallel with one another in a first direction and spaced apart from one another in a second direction, wherein a p-type anode well has a length in the first direction and a width in the second direction; wherein the length of the p-type anode well is greater than the width of the p-type anode well; an n-type well r…
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
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