Annealing for damage free laser processing for high efficiency solar cells
US-9214585-B2 · Dec 15, 2015 · US
US9123840B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9123840-B2 |
| Application number | US-201213982230-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jan 27, 2012 |
| Priority date | Jan 27, 2011 |
| Publication date | Sep 1, 2015 |
| Grant date | Sep 1, 2015 |
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A method for manufacturing a solar cell element is disclosed. The method includes two different etching processes followed by forming a semiconductor layer. A semiconductor substrate having a first conductor type is etched by using a first acid aqueous solution containing hydrofluoric acid, nitric acid, and sulfuric acid. Then, the semiconductor substrate is etched by using a second acid aqueous solution containing hydrofluoric acid and nitric acid with substantially no sulfuric acid to make an uneven surface. A semiconductor layer of second conductivity type different from the first conductivity type is formed on at least a part of the uneven surface of the semiconductor substrate.
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The invention claimed is: 1. A method for manufacturing a solar cell element, the method comprising: etching a first main surface of a semiconductor substrate having a first conductivity type, using a first acid aqueous solution containing hydrofluoric acid, nitric acid, and sulfuric acid to obtain a first etched surface; etching the first etched surface using a second acid aqueous solution containing hydrofluoric acid and nitric acid with substantially no sulfuric acid to obtain a second etched surface having an uneven surface; and forming a semiconductor layer on at least a part of the second etched surface, the layer having a second conductivity type different from the first conductivity type. 2. The method according to claim 1 , wherein the second acid aqueous solution has a temperature lower than that of the first acid aqueous solution. 3. The method according to claim 1 , wherein the second acid aqueous solution has a mass ratio of the nitric acid to the hydrofluoric acid higher than that of the first acid aqueous solution. 4. The method according to claim 1 , further comprising: washing the first etched surface with water for a first period of time; and washing the second etched surface with water for a second period of time longer than the first period. 5. The method according to claim 1 , wherein the substrate is immersed in the first acid aqueous solution with the first main surface substantially perpendicular to a fluid surface of the first acid aqueous solution. 6. The method according to claim 1 , further comprising preparing the substrate by slicing an ingot of a semiconductor material with a wire to which an abrasive is fixed.
of the semiconductor bodies, e.g. textured active layers · CPC title
Photovoltaic cells having only PN homojunction potential barriers · CPC title
Shape of semiconductor bodies; Shapes, relative sizes or dispositions of semiconductor regions within semiconductor bodies · CPC title
Electricity · mapped topic
Electricity · mapped topic
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