Semiconductor device and method of manufacturing same
US-2024395697-A1 · Nov 28, 2024 · US
US9123784B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9123784-B2 |
| Application number | US-201213590204-A |
| Country | US |
| Kind code | B2 |
| Filing date | Aug 21, 2012 |
| Priority date | Aug 21, 2012 |
| Publication date | Sep 1, 2015 |
| Grant date | Sep 1, 2015 |
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Official abstract text for this publication.
A memory process is described. A substrate is provided, having therein trenches and conductive lines buried in the trenches and having thereon an array area, wherein each of the conductive lines has an array portion in the array area. A contact area apart from the array area is defined on the substrate, wherein each of the conductive lines has a contact portion in the contact area. The substrate between the contact portions of the conductive lines is etched down to below the tops of the conductive layers to form gaps between the contact portions of the conductive lines. The gaps are then filled with an insulating layer.
Opening claim text (preview).
What is claimed is: 1. A memory structure, comprising: a substrate, having therein a plurality of trenches, and having thereon an array area and a contact area apart from the array area, wherein each trench has a first portion in the contact area and a second portion in the array area, and the substrate between the first portions of the trenches is also in the contact area and has a surface lower than a surface of the substrate between the trenches outside of the contact area; a…
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
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