Gradient metal liner for interconnect structures
US-2024332075-A1 · Oct 3, 2024 · US
US9123783B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9123783-B2 |
| Application number | US-201213673549-A |
| Country | US |
| Kind code | B2 |
| Filing date | Nov 9, 2012 |
| Priority date | Nov 9, 2012 |
| Publication date | Sep 1, 2015 |
| Grant date | Sep 1, 2015 |
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Integrated circuits and methods of forming integrated circuits are provided herein. In an embodiment, a method of forming an integrated circuit includes providing a base substrate having an embedded electrical contact disposed therein. An interlayer dielectric is formed overlying the base substrate, and a recess is etched through the interlayer dielectric over the embedded electrical contact. A protecting liner is formed in the recess and over an exposed surface of the embedded electrical contact in the recess. The protecting liner includes at least two liner layers that have materially different etch rates in different etchants. A portion of the protecting liner is removed over the surface of the embedded electrical contact to again expose the surface of the embedded electrical contact in the recess. An embedded electrical interconnect is formed in the recess. The embedded electrical interconnect overlies the protecting liner on sides of the recess.
Opening claim text (preview).
What is claimed is: 1. A method of forming an integrated circuit, the method comprising: providing a base substrate having an embedded electrical contact disposed therein; forming an interlayer dielectric overlying the base substrate; etching a recess through the interlayer dielectric over the embedded electrical contact with a surface of the embedded electrical contact exposed in the recess; forming a protecting liner in the recess and over the exposed surface of the embedd…
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
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