Methods of forming semiconductor devices
US-2024387699-A1 · Nov 21, 2024 · US
US9111997B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-9111997-B2 |
| Application number | US-201113339427-A |
| Country | US |
| Kind code | B2 |
| Filing date | Dec 29, 2011 |
| Priority date | Mar 26, 2007 |
| Publication date | Aug 18, 2015 |
| Grant date | Aug 18, 2015 |
A practical reading order for non-experts. Skip the full description unless you need deep technical detail.
What the patent document calls the invention.
A short plain-language summary of the technical disclosure.
Who owns or filed the patent and who is credited as inventor.
Filing, priority, publication, and grant dates set the timeline.
The legal scope of protection — read this for what is actually claimed.
Technology tags used to group this patent with similar filings.
Prior art links and similar publications in this corpus.
Official abstract text for this publication.
An SOI substrate and a manufacturing method of the SOI substrate, by which enlargement of the substrate is possible and its productivity can be increased, are provided. A step (A) of cutting a first single crystal silicon substrate to form a second single crystal silicon substrate which has a chip size; a step (B) of forming an insulating layer on one surface of the second single crystal silicon substrate, and forming an embrittlement layer in the second single crystal substrate; and a step (C) of bonding a substrate having an insulating surface and the second single crystal silicon substrate with the insulating layer therebetween, and conducting heat treatment to separate the second single crystal silicon substrate along the embrittlement layer, and forming a single crystal silicon thin film on the substrate having an insulating surface, are conducted.
Opening claim text (preview).
What is claimed is: 1. A manufacturing method of an SOI substrate, comprising the steps of: forming an insulating layer on one surface of a first single crystal silicon substrate; forming an embrittlement layer in the first single crystal silicon substrate; cutting the first single crystal silicon substrate to form a plurality of second single crystal silicon substrates each of which has a chip size after the step of forming the embrittlement layer; bonding a substrate havin…
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Electricity · mapped topic
Related publications grouped by family.
Free tools are coming soon. Tell us what you want to track and we'll notify you.
Answers are generated from the same data shown on this page.